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Title: Fly-scan ptychography

Abstract

We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.

Authors:
 [1];  [1];  [2];  [1];  [1];  [3];  [4];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Center for Free-Electron Laser Science, Deutsches Elektronensynchrotron, Hamburg (Germany)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
  4. Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Research Complex at Harwell, Oxfordshire (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1201502
Alternate Identifier(s):
OSTI ID: 1222219; OSTI ID: 1222644
Grant/Contract Number:  
AC02-98CH10886; AC02-06CH11357; AC03-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 5; Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; microscopy; x-rays

Citation Formats

Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fly-scan ptychography. United States: N. p., 2015. Web. doi:10.1038/srep09074.
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., & Chu, Yong S. Fly-scan ptychography. United States. https://doi.org/10.1038/srep09074
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fri . "Fly-scan ptychography". United States. https://doi.org/10.1038/srep09074. https://www.osti.gov/servlets/purl/1201502.
@article{osti_1201502,
title = {Fly-scan ptychography},
author = {Huang, Xiaojing and Lauer, Kenneth and Clark, Jesse N. and Xu, Weihe and Nazaretski, Evgeny and Harder, Ross and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.},
doi = {10.1038/srep09074},
journal = {Scientific Reports},
number = 1,
volume = 5,
place = {United States},
year = {Fri Mar 13 00:00:00 EDT 2015},
month = {Fri Mar 13 00:00:00 EDT 2015}
}

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Cited by: 60 works
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