Fly-scan ptychography
Abstract
We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.
- Authors:
-
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Center for Free-Electron Laser Science, Deutsches Elektronensynchrotron, Hamburg (Germany)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Research Complex at Harwell, Oxfordshire (United Kingdom)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1201502
- Alternate Identifier(s):
- OSTI ID: 1222219; OSTI ID: 1222644
- Grant/Contract Number:
- AC02-98CH10886; AC02-06CH11357; AC03-76SF00515
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 5; Journal Issue: 1; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; microscopy; x-rays
Citation Formats
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fly-scan ptychography. United States: N. p., 2015.
Web. doi:10.1038/srep09074.
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., & Chu, Yong S. Fly-scan ptychography. United States. https://doi.org/10.1038/srep09074
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fri .
"Fly-scan ptychography". United States. https://doi.org/10.1038/srep09074. https://www.osti.gov/servlets/purl/1201502.
@article{osti_1201502,
title = {Fly-scan ptychography},
author = {Huang, Xiaojing and Lauer, Kenneth and Clark, Jesse N. and Xu, Weihe and Nazaretski, Evgeny and Harder, Ross and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.},
doi = {10.1038/srep09074},
journal = {Scientific Reports},
number = 1,
volume = 5,
place = {United States},
year = {Fri Mar 13 00:00:00 EDT 2015},
month = {Fri Mar 13 00:00:00 EDT 2015}
}
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