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Title: Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets

The development of electron, and scanning probe microscopies in the second half of the twentieth century have produced spectacular images of internal structure and composition of matter with, at nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition and analysis. The progress in imaging technologies in the beginning of the twenty first century has opened the proverbial floodgates of high-veracity information on structure and functionality. High resolution imaging now allows information on atomic positions with picometer precision, allowing for quantitative measurements of individual bond length and angles. Functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this data into physically and chemically relevant information from imaging data.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Seoul National Univ. (Korea, Republic of)
Publication Date:
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Advanced Structural and Chemical Imaging
Additional Journal Information:
Journal Volume: 1; Journal Issue: 6; Journal ID: ISSN 2198-0926
Publisher:
Springer
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING
OSTI Identifier:
1214489

Belianinov, Alex, Vasudevan, Rama K, Strelcov, Evgheni, Steed, Chad A, Yang, Sang Mo, Tselev, Alexander, Jesse, Stephen, Biegalski, Michael D, Shipman, Galen M, Symons, Christopher T, Borisevich, Albina Y, Archibald, Richard K, and Kalinin, Sergei. Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets. United States: N. p., Web. doi:10.1186/s40679-015-0006-6.
Belianinov, Alex, Vasudevan, Rama K, Strelcov, Evgheni, Steed, Chad A, Yang, Sang Mo, Tselev, Alexander, Jesse, Stephen, Biegalski, Michael D, Shipman, Galen M, Symons, Christopher T, Borisevich, Albina Y, Archibald, Richard K, & Kalinin, Sergei. Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets. United States. doi:10.1186/s40679-015-0006-6.
Belianinov, Alex, Vasudevan, Rama K, Strelcov, Evgheni, Steed, Chad A, Yang, Sang Mo, Tselev, Alexander, Jesse, Stephen, Biegalski, Michael D, Shipman, Galen M, Symons, Christopher T, Borisevich, Albina Y, Archibald, Richard K, and Kalinin, Sergei. 2015. "Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets". United States. doi:10.1186/s40679-015-0006-6. https://www.osti.gov/servlets/purl/1214489.
@article{osti_1214489,
title = {Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets},
author = {Belianinov, Alex and Vasudevan, Rama K and Strelcov, Evgheni and Steed, Chad A and Yang, Sang Mo and Tselev, Alexander and Jesse, Stephen and Biegalski, Michael D and Shipman, Galen M and Symons, Christopher T and Borisevich, Albina Y and Archibald, Richard K and Kalinin, Sergei},
abstractNote = {The development of electron, and scanning probe microscopies in the second half of the twentieth century have produced spectacular images of internal structure and composition of matter with, at nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition and analysis. The progress in imaging technologies in the beginning of the twenty first century has opened the proverbial floodgates of high-veracity information on structure and functionality. High resolution imaging now allows information on atomic positions with picometer precision, allowing for quantitative measurements of individual bond length and angles. Functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this data into physically and chemically relevant information from imaging data.},
doi = {10.1186/s40679-015-0006-6},
journal = {Advanced Structural and Chemical Imaging},
number = 6,
volume = 1,
place = {United States},
year = {2015},
month = {5}
}

Works referenced in this record:

Large field-induced strains in a lead-free piezoelectric material
journal, January 2011
  • Zhang, J. X.; Xiang, B.; He, Q.
  • Nature Nanotechnology, Vol. 6, Issue 2, p. 98-102
  • DOI: 10.1038/nnano.2010.265

Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy
journal, November 2000
  • Roelofs, A.; Böttger, U.; Waser, R.
  • Applied Physics Letters, Vol. 77, Issue 21, p. 3444-3446
  • DOI: 10.1063/1.1328049

Information foraging.
journal, October 1999

Nanometer-scale flow of molten polyethylene from a heated atomic force microscope tip
journal, May 2012

Local Conduction at the BiFeO3-CoFe2O4 Tubular Oxide Interface
journal, July 2012
  • Hsieh, Ying-Hui; Liou, Jia-Ming; Huang, Bo-Chao
  • Advanced Materials, Vol. 24, Issue 33, p. 4564-4568
  • DOI: 10.1002/adma.201201929

Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006