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Title: Current-induced depairing in the Bi 2 Te 3 / FeTe interfacial superconductor

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Grant/Contract Number:
FG02-99ER45763
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 92; Journal Issue: 9; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1213753

Kunchur, M. N., Dean, C. L., Moghadam, N. Shayesteh, Knight, J. M., He, Q. L., Liu, H., Wang, J., Lortz, R., Sou, I. K., and Gurevich, A.. Current-induced depairing in the Bi 2 Te 3 / FeTe interfacial superconductor. United States: N. p., Web. doi:10.1103/PhysRevB.92.094502.
Kunchur, M. N., Dean, C. L., Moghadam, N. Shayesteh, Knight, J. M., He, Q. L., Liu, H., Wang, J., Lortz, R., Sou, I. K., & Gurevich, A.. Current-induced depairing in the Bi 2 Te 3 / FeTe interfacial superconductor. United States. doi:10.1103/PhysRevB.92.094502.
Kunchur, M. N., Dean, C. L., Moghadam, N. Shayesteh, Knight, J. M., He, Q. L., Liu, H., Wang, J., Lortz, R., Sou, I. K., and Gurevich, A.. 2015. "Current-induced depairing in the Bi 2 Te 3 / FeTe interfacial superconductor". United States. doi:10.1103/PhysRevB.92.094502.
@article{osti_1213753,
title = {Current-induced depairing in the Bi 2 Te 3 / FeTe interfacial superconductor},
author = {Kunchur, M. N. and Dean, C. L. and Moghadam, N. Shayesteh and Knight, J. M. and He, Q. L. and Liu, H. and Wang, J. and Lortz, R. and Sou, I. K. and Gurevich, A.},
abstractNote = {},
doi = {10.1103/PhysRevB.92.094502},
journal = {Physical Review B},
number = 9,
volume = 92,
place = {United States},
year = {2015},
month = {9}
}