Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging
Abstract
An investigation of an off-the-shelf solid-state lighting device with the primary focus on the accompanied light-emitting diode (LED) electrical driver (ED) has been conducted. A set of 10 EDs were exposed to temperature humidity life testing of 85% RH and 85 C (85/85) without an electrical bias per the JEDEC standard JESD22-A101C in order to accelerate the ingress of moisture into the aluminum electrolytic capacitor (AEC) and the EDs in order to assess the reliability of the LED drivers for harsh environment applications. The capacitance and equivalent series resistance for each AEC inside the ED were measured using a handheld LCR meter as possible leading indications of failure. The photometric quantities of a single pristine light engine were monitored in order to investigate the interaction between the light engine and the EDs. These parameters were used in assessing the overall reliability of the EDs. In addition, a comparative analysis has been conducted between the 85/85 accelerated test data and a previously published high-temperature storage life accelerated test of 135°C. The results of the 85/85 acceleration test and the comparative analysis are presented in this paper.
- Authors:
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States); RTI International, Research Triangle Park, NC (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Energy Efficiency Office. Building Technologies Office
- OSTI Identifier:
- 1825125
- Alternate Identifier(s):
- OSTI ID: 1212878
- Grant/Contract Number:
- EE0005124
- Resource Type:
- Published Article
- Journal Name:
- IEEE Access
- Additional Journal Information:
- Journal Name: IEEE Access Journal Volume: 3; Journal ID: ISSN 2169-3536
- Publisher:
- Institute of Electrical and Electronics Engineers
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION; Electrolytic capacitor; solid-state lighting; LED
Citation Formats
Lall, Pradeep, Sakalaukus, Peter, and Davis, Lynn. Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging. United States: N. p., 2015.
Web. doi:10.1109/ACCESS.2015.2404812.
Lall, Pradeep, Sakalaukus, Peter, & Davis, Lynn. Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging. United States. https://doi.org/10.1109/ACCESS.2015.2404812
Lall, Pradeep, Sakalaukus, Peter, and Davis, Lynn. Thu .
"Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging". United States. https://doi.org/10.1109/ACCESS.2015.2404812.
@article{osti_1825125,
title = {Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging},
author = {Lall, Pradeep and Sakalaukus, Peter and Davis, Lynn},
abstractNote = {An investigation of an off-the-shelf solid-state lighting device with the primary focus on the accompanied light-emitting diode (LED) electrical driver (ED) has been conducted. A set of 10 EDs were exposed to temperature humidity life testing of 85% RH and 85 C (85/85) without an electrical bias per the JEDEC standard JESD22-A101C in order to accelerate the ingress of moisture into the aluminum electrolytic capacitor (AEC) and the EDs in order to assess the reliability of the LED drivers for harsh environment applications. The capacitance and equivalent series resistance for each AEC inside the ED were measured using a handheld LCR meter as possible leading indications of failure. The photometric quantities of a single pristine light engine were monitored in order to investigate the interaction between the light engine and the EDs. These parameters were used in assessing the overall reliability of the EDs. In addition, a comparative analysis has been conducted between the 85/85 accelerated test data and a previously published high-temperature storage life accelerated test of 135°C. The results of the 85/85 acceleration test and the comparative analysis are presented in this paper.},
doi = {10.1109/ACCESS.2015.2404812},
journal = {IEEE Access},
number = ,
volume = 3,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}
https://doi.org/10.1109/ACCESS.2015.2404812
Web of Science