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Title: Improved Measurement of the π e ν Branching Ratio

A new measurement of the branching ratio R e/μ=Γ(π + → e +ν + π + → e +νγ)/Γ(π+ → μ+ν + π +→μ+νγ) resulted in R exp e/μ=[1.2344±0.0023(stat)±0.0019(syst)] x 10 -4. This is in agreement with the standard model prediction and improves the test of electron-muon universality to the level of 0.1%.
Authors:
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Publication Date:
Report Number(s):
BNL-108222-2015-JA
Journal ID: ISSN 0031-9007; PRLTAO; R&D Project: PO-022; KA2201020; TRN: US1600770
Grant/Contract Number:
SC00112704
Type:
Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 115; Journal Issue: 7; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Contributing Orgs:
PIENU Collaboration
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; measurement; branching; ratio
OSTI Identifier:
1210170

Aguilar-Arevalo, A., Aoki, M., Blecher, M., Britton, D. I., Bryman, D. A., vom Bruch, D., Chen, S., Comfort, J., Ding, M., Doria, L., Cuen-Rochin, S., Gumplinger, P., Hussein, A., Igarashi, Y., Ito, S., Kettell, S. H., Kurchaninov, L., Littenberg, L. S., Malbrunot, C., Mischke, R. E., Numao, T., Protopopescu, D., Sher, A., Sullivan, T., Vavilov, D., and Yamada, K.. Improved Measurement of the π→eν Branching Ratio. United States: N. p., Web. doi:10.1103/PhysRevLett.115.071801.
Aguilar-Arevalo, A., Aoki, M., Blecher, M., Britton, D. I., Bryman, D. A., vom Bruch, D., Chen, S., Comfort, J., Ding, M., Doria, L., Cuen-Rochin, S., Gumplinger, P., Hussein, A., Igarashi, Y., Ito, S., Kettell, S. H., Kurchaninov, L., Littenberg, L. S., Malbrunot, C., Mischke, R. E., Numao, T., Protopopescu, D., Sher, A., Sullivan, T., Vavilov, D., & Yamada, K.. Improved Measurement of the π→eν Branching Ratio. United States. doi:10.1103/PhysRevLett.115.071801.
Aguilar-Arevalo, A., Aoki, M., Blecher, M., Britton, D. I., Bryman, D. A., vom Bruch, D., Chen, S., Comfort, J., Ding, M., Doria, L., Cuen-Rochin, S., Gumplinger, P., Hussein, A., Igarashi, Y., Ito, S., Kettell, S. H., Kurchaninov, L., Littenberg, L. S., Malbrunot, C., Mischke, R. E., Numao, T., Protopopescu, D., Sher, A., Sullivan, T., Vavilov, D., and Yamada, K.. 2015. "Improved Measurement of the π→eν Branching Ratio". United States. doi:10.1103/PhysRevLett.115.071801. https://www.osti.gov/servlets/purl/1210170.
@article{osti_1210170,
title = {Improved Measurement of the π→eν Branching Ratio},
author = {Aguilar-Arevalo, A. and Aoki, M. and Blecher, M. and Britton, D. I. and Bryman, D. A. and vom Bruch, D. and Chen, S. and Comfort, J. and Ding, M. and Doria, L. and Cuen-Rochin, S. and Gumplinger, P. and Hussein, A. and Igarashi, Y. and Ito, S. and Kettell, S. H. and Kurchaninov, L. and Littenberg, L. S. and Malbrunot, C. and Mischke, R. E. and Numao, T. and Protopopescu, D. and Sher, A. and Sullivan, T. and Vavilov, D. and Yamada, K.},
abstractNote = {A new measurement of the branching ratio Re/μ=Γ(π+ → e+ν + π+ → e+νγ)/Γ(π+ → μ+ν + π+→μ+νγ) resulted in Rexpe/μ=[1.2344±0.0023(stat)±0.0019(syst)] x 10-4. This is in agreement with the standard model prediction and improves the test of electron-muon universality to the level of 0.1%.},
doi = {10.1103/PhysRevLett.115.071801},
journal = {Physical Review Letters},
number = 7,
volume = 115,
place = {United States},
year = {2015},
month = {8}
}