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Title: High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films

Abstract

The out of plane electrical conductivity of highly anisotropic Bi2Te3 films grown via electro-deposition process was determined using four probe current-voltage measurements performed on 4.6 - 7.2 μm thickness Bi2Te3 mesa structures with 80 - 120 μm diameters sandwiched between metallic film electrodes. A three-dimensional finite element model was used to predict the electric field distribution in the measured structures and take into account the non-uniform distribution of the current in the electrodes in the vicinity of the probes. The finite-element modeling shows that significant errors could arise in the measured film electrical conductivity if simpler one-dimensional models are employed. In conclusion, a high electrical conductivity of (3.2 ± 0.4) · 105S/m is reported along the out of plane direction for Bi2Te3 films highly oriented in the [1 1 0] direction.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1210110
Alternate Identifier(s):
OSTI ID: 1420650; OSTI ID: 1459182
Grant/Contract Number:  
SC0001299
Resource Type:
Published Article
Journal Name:
AIP Advances
Additional Journal Information:
Journal Name: AIP Advances Journal Volume: 5 Journal Issue: 8; Journal ID: ISSN 2158-3226
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Rojo, Miguel Muñoz, Manzano, Cristina V., Granados, Daniel, Osorio, M. R., Borca-Tasciuc, Theodorian, and Martín-González, Marisol. High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films. United States: N. p., 2015. Web. doi:10.1063/1.4928863.
Rojo, Miguel Muñoz, Manzano, Cristina V., Granados, Daniel, Osorio, M. R., Borca-Tasciuc, Theodorian, & Martín-González, Marisol. High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films. United States. https://doi.org/10.1063/1.4928863
Rojo, Miguel Muñoz, Manzano, Cristina V., Granados, Daniel, Osorio, M. R., Borca-Tasciuc, Theodorian, and Martín-González, Marisol. Sat . "High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films". United States. https://doi.org/10.1063/1.4928863.
@article{osti_1210110,
title = {High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films},
author = {Rojo, Miguel Muñoz and Manzano, Cristina V. and Granados, Daniel and Osorio, M. R. and Borca-Tasciuc, Theodorian and Martín-González, Marisol},
abstractNote = {The out of plane electrical conductivity of highly anisotropic Bi2Te3 films grown via electro-deposition process was determined using four probe current-voltage measurements performed on 4.6 - 7.2 μm thickness Bi2Te3 mesa structures with 80 - 120 μm diameters sandwiched between metallic film electrodes. A three-dimensional finite element model was used to predict the electric field distribution in the measured structures and take into account the non-uniform distribution of the current in the electrodes in the vicinity of the probes. The finite-element modeling shows that significant errors could arise in the measured film electrical conductivity if simpler one-dimensional models are employed. In conclusion, a high electrical conductivity of (3.2 ± 0.4) · 105S/m is reported along the out of plane direction for Bi2Te3 films highly oriented in the [1 1 0] direction.},
doi = {10.1063/1.4928863},
journal = {AIP Advances},
number = 8,
volume = 5,
place = {United States},
year = {Sat Aug 01 00:00:00 EDT 2015},
month = {Sat Aug 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4928863

Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

Figures / Tables:

FIG. 1 FIG. 1: Some of the techniques used to measure in plane and out of plane electrical conductivity of films and bulk samples. a) In-plane four point probe b) Van der Pauw c) Modified Transmission Line d) Cox and Strack and e) Cross-plane four probe technique.

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Works referenced in this record:

CRC Handbook of Thermoelectrics
book, January 2017


Thin film Thermoelectric Characterization Techniques
journal, January 2013


Review on measurement techniques of transport properties of nanowires
journal, January 2013

  • Rojo, Miguel Muñoz; Calero, Olga Caballero; Lopeandia, A. F.
  • Nanoscale, Vol. 5, Issue 23
  • DOI: 10.1039/c3nr03242f

Phosphorus-Doped Carbon Nitride Solid: Enhanced Electrical Conductivity and Photocurrent Generation
journal, May 2010

  • Zhang, Yuanjian; Mori, Toshiyuki; Ye, Jinhua
  • Journal of the American Chemical Society, Vol. 132, Issue 18
  • DOI: 10.1021/ja101749y

Review of Thermoelectric Materials
book, August 2009


Electrical Resistivity Measurements: a Review
journal, January 2013


Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature
journal, December 2004

  • Pesavento, Paul V.; Chesterfield, Reid J.; Newman, Christopher R.
  • Journal of Applied Physics, Vol. 96, Issue 12
  • DOI: 10.1063/1.1806533

Four-probe measurements of the in-plane thermoelectric properties of nanofilms
journal, March 2007

  • Mavrokefalos, Anastassios; Pettes, Michael T.; Zhou, Feng
  • Review of Scientific Instruments, Vol. 78, Issue 3
  • DOI: 10.1063/1.2712894

Measurements of anisotropic thermoelectric properties in superlattices
journal, November 2002

  • Yang, B.; Liu, W. L.; Liu, J. L.
  • Applied Physics Letters, Vol. 81, Issue 19
  • DOI: 10.1063/1.1515876

Thin-film thermoelectric devices with high room-temperature figures of merit
journal, October 2001

  • Venkatasubramanian, Rama; Siivola, Edward; Colpitts, Thomas
  • Nature, Vol. 413, Issue 6856, p. 597-602
  • DOI: 10.1038/35098012

Models for contacts to planar devices
journal, February 1972


Ohmic contacts for GaAs devices
journal, December 1967


Micro-thermoelectric cooler: interfacial effects on thermal and electrical transport
journal, May 2004


Reliable contact fabrication on nanostructured Bi2Te3-based thermoelectric materials
journal, January 2013

  • Feng, Shien-Ping; Chang, Ya-Huei; Yang, Jian
  • Physical Chemistry Chemical Physics, Vol. 15, Issue 18
  • DOI: 10.1039/c3cp50993a

Thermoelectric Properties as a Function of Electronic Band Structure and Microstructure of Textured Materials
journal, February 2010


Thermoelectric properties of Bi2Te3 films by constant and pulsed electrodeposition
journal, April 2013

  • Manzano, Cristina V.; Rojas, Adriana A.; Decepida, Michelle
  • Journal of Solid State Electrochemistry, Vol. 17, Issue 7
  • DOI: 10.1007/s10008-013-2066-7

Electrical contact resistances of thermoelectric thin films measured by Kelvin probe microscopy
journal, October 2013

  • Muñoz-Rojo, Miguel; Caballero-Calero, Olga; Martín-González, Marisol
  • Applied Physics Letters, Vol. 103, Issue 18
  • DOI: 10.1063/1.4826684

Size-dependent electrical constriction resistance for contacts of arbitrary size: from Sharvin to Holm limits
journal, December 1999


Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.