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Title: Fly-scan ptychography

Abstract

We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.

Authors:
 [1];  [1];  [2];  [1];  [1];  [3];  [4];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Center for Free-Electron Laser Science, Deutsches Elektronensynchrotron, Hamburg (Germany)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
  4. Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Research Complex at Harwell, Oxfordshire (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States); Argonne National Lab. (ANL), Argonne, IL (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1201502
Alternate Identifier(s):
OSTI ID: 1222219; OSTI ID: 1222644
Grant/Contract Number:  
AC02-98CH10886; AC02-06CH11357; AC03-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 5; Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; microscopy; x-rays

Citation Formats

Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fly-scan ptychography. United States: N. p., 2015. Web. doi:10.1038/srep09074.
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., & Chu, Yong S. Fly-scan ptychography. United States. doi:10.1038/srep09074.
Huang, Xiaojing, Lauer, Kenneth, Clark, Jesse N., Xu, Weihe, Nazaretski, Evgeny, Harder, Ross, Robinson, Ian K., and Chu, Yong S. Fri . "Fly-scan ptychography". United States. doi:10.1038/srep09074. https://www.osti.gov/servlets/purl/1201502.
@article{osti_1201502,
title = {Fly-scan ptychography},
author = {Huang, Xiaojing and Lauer, Kenneth and Clark, Jesse N. and Xu, Weihe and Nazaretski, Evgeny and Harder, Ross and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.},
doi = {10.1038/srep09074},
journal = {Scientific Reports},
number = 1,
volume = 5,
place = {United States},
year = {2015},
month = {3}
}

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Cited by: 9 works
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Works referenced in this record:

Resolution beyond the 'information limit' in transmission electron microscopy
journal, April 1995

  • Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M.
  • Nature, Vol. 374, Issue 6523
  • DOI: 10.1038/374630a0

Phase-retrieval X-ray microscopy by Wigner-distribution deconvolution
journal, December 1996


Movable Aperture Lensless Transmission Microscopy: A Novel Phase Retrieval Algorithm
journal, July 2004


Hard-X-Ray Lensless Imaging of Extended Objects
journal, January 2007


High-Resolution Scanning X-ray Diffraction Microscopy
journal, July 2008


Phase retrieval with transverse translation diversity: a nonlinear optimization approach
journal, January 2008

  • Guizar-Sicairos, Manuel; Fienup, James R.
  • Optics Express, Vol. 16, Issue 10
  • DOI: 10.1364/OE.16.007264

An improved ptychographical phase retrieval algorithm for diffractive imaging
journal, September 2009


Maximum-likelihood refinement for coherent diffractive imaging
journal, June 2012


Noise models for low counting rate coherent diffraction imaging
journal, January 2012

  • Godard, Pierre; Allain, Marc; Chamard, Virginie
  • Optics Express, Vol. 20, Issue 23
  • DOI: 10.1364/OE.20.025914

Ptychographic X-ray computed tomography at the nanoscale
journal, September 2010

  • Dierolf, Martin; Menzel, Andreas; Thibault, Pierre
  • Nature, Vol. 467, Issue 7314
  • DOI: 10.1038/nature09419

X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
journal, January 2014

  • Holler, M.; Diaz, A.; Guizar-Sicairos, M.
  • Scientific Reports, Vol. 4, Issue 1
  • DOI: 10.1038/srep03857

Three-dimensional high-resolution quantitative microscopy of extended crystals
journal, September 2011

  • Godard, P.; Carbone, G.; Allain, M.
  • Nature Communications, Vol. 2, Issue 1
  • DOI: 10.1038/ncomms1569

Three-dimensional Bragg coherent diffraction imaging of an extended ZnO crystal
journal, June 2012

  • Huang, Xiaojing; Harder, Ross; Leake, Steven
  • Journal of Applied Crystallography, Vol. 45, Issue 4
  • DOI: 10.1107/S0021889812018900

Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography
journal, September 2012

  • Hruszkewycz, S. O.; Holt, M. V.; Murray, C. E.
  • Nano Letters, Vol. 12, Issue 10
  • DOI: 10.1021/nl303201w

Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography
journal, April 2013

  • Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V.
  • Physical Review Letters, Vol. 110, Issue 17, Article No. 177601
  • DOI: 10.1103/PhysRevLett.110.177601

Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data
journal, January 2010

  • Kewish, Cameron M.; Guizar-Sicairos, Manuel; Liu, Chian
  • Optics Express, Vol. 18, Issue 22
  • DOI: 10.1364/OE.18.023420

Hard x-ray nanobeam characterization by coherent diffraction microscopy
journal, March 2010

  • Schropp, A.; Boye, P.; Feldkamp, J. M.
  • Applied Physics Letters, Vol. 96, Issue 9
  • DOI: 10.1063/1.3332591

Measurement of hard x-ray lens wavefront aberrations using phase retrieval
journal, March 2011

  • Guizar-Sicairos, Manuel; Narayanan, Suresh; Stein, Aaron
  • Applied Physics Letters, Vol. 98, Issue 11
  • DOI: 10.1063/1.3558914

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging
journal, January 2011

  • Hönig, Susanne; Hoppe, Robert; Patommel, Jens
  • Optics Express, Vol. 19, Issue 17
  • DOI: 10.1364/OE.19.016324

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging
journal, January 2011

  • Vila-Comamala, Joan; Diaz, Ana; Guizar-Sicairos, Manuel
  • Optics Express, Vol. 19, Issue 22
  • DOI: 10.1364/OE.19.021333

Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval
journal, January 2012

  • Huang, Xiaojing; Wojcik, Michael; Burdet, Nicolas
  • Optics Express, Vol. 20, Issue 21
  • DOI: 10.1364/OE.20.024038

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging
journal, April 2013

  • Schropp, Andreas; Hoppe, Robert; Meier, Vivienne
  • Scientific Reports, Vol. 3, Issue 1
  • DOI: 10.1038/srep01633

11 nm hard X-ray focus from a large-aperture multilayer Laue lens
journal, December 2013

  • Huang, Xiaojing; Yan, Hanfei; Nazaretski, Evgeny
  • Scientific Reports, Vol. 3, Issue 1
  • DOI: 10.1038/srep03562

Characterization of x-ray phase vortices by ptychographic coherent diffractive imaging
journal, January 2014

  • Vila-Comamala, J.; Sakdinawat, A.; Guizar-Sicairos, M.
  • Optics Letters, Vol. 39, Issue 18
  • DOI: 10.1364/OL.39.005281

An instrument for 3D x-ray nano-imaging
journal, July 2012

  • Holler, M.; Raabe, J.; Diaz, A.
  • Review of Scientific Instruments, Vol. 83, Issue 7
  • DOI: 10.1063/1.4737624

Design and performance of a scanning ptychography microscope
journal, March 2014

  • Nazaretski, E.; Huang, X.; Yan, H.
  • Review of Scientific Instruments, Vol. 85, Issue 3
  • DOI: 10.1063/1.4868968

High-throughput ptychography using Eiger-scanning X-ray nano-imaging of extended regions
journal, January 2014

  • Guizar-Sicairos, Manuel; Johnson, Ian; Diaz, Ana
  • Optics Express, Vol. 22, Issue 12
  • DOI: 10.1364/OE.22.014859

Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source
journal, February 2003

  • Kilcoyne, A. L. D.; Tyliszczak, T.; Steele, W. F.
  • Journal of Synchrotron Radiation, Vol. 10, Issue 2
  • DOI: 10.1107/S0909049502017739

Reconstructing state mixtures from diffraction measurements
journal, February 2013


Dynamic Imaging Using Ptychography
journal, March 2014


Ptychography with broad-bandwidth radiation
journal, April 2014

  • Enders, B.; Dierolf, M.; Cloetens, P.
  • Applied Physics Letters, Vol. 104, Issue 17
  • DOI: 10.1063/1.4874304

Coherent methods in the X-ray sciences
journal, January 2010


Continuous scanning mode for ptychography
journal, January 2014

  • Clark, Jesse N.; Huang, Xiaojing; Harder, Ross J.
  • Optics Letters, Vol. 39, Issue 20
  • DOI: 10.1364/OL.39.006066

Ptychographic coherent diffractive imaging of weakly scattering specimens
journal, March 2010


Dynamic sample imaging in coherent diffractive imaging
journal, January 2011

  • Clark, Jesse N.; Putkunz, Corey T.; Curwood, Evan K.
  • Optics Letters, Vol. 36, Issue 11
  • DOI: 10.1364/OL.36.001954

Capturing dynamics with Eiger, a fast-framing X-ray detector
journal, September 2012

  • Johnson, I.; Bergamaschi, A.; Buitenhuis, J.
  • Journal of Synchrotron Radiation, Vol. 19, Issue 6
  • DOI: 10.1107/S0909049512035972

Optimization of overlap uniformness for ptychography
journal, January 2014

  • Huang, Xiaojing; Yan, Hanfei; Harder, Ross
  • Optics Express, Vol. 22, Issue 10
  • DOI: 10.1364/OE.22.012634

Influence of the overlap parameter on the convergence of the ptychographical iterative engine
journal, April 2008


On-the-fly scans for X-ray ptychography
journal, December 2014

  • Pelz, Philipp M.; Guizar-Sicairos, Manuel; Thibault, Pierre
  • Applied Physics Letters, Vol. 105, Issue 25
  • DOI: 10.1063/1.4904943

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    Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization
    journal, January 2019

    • Zhao, Chonghang; Kisslinger, Kim; Huang, Xiaojing
    • Materials Horizons, Vol. 6, Issue 10
    • DOI: 10.1039/c9mh00669a