In situ visualization of metallurgical reactions in nanoscale Cu/Sn diffusion couples

Yin, Qiyue; Stach, Eric A.; Gao, Fan; Zhou, Guangwen; Gu, Zhiyong

doi:10.1039/c4nr06757f

Title: In situ visualization of metallurgical reactions in nanoscale Cu/Sn diffusion couples

Journal Article · 09 February 2015 · Nanoscale

DOI: https://doi.org/10.1039/c4nr06757f · OSTI ID:1193240

Yin, Qiyue ^[1]; Stach, Eric A. ^[2]; Gao, Fan ^[3]; Zhou, Guangwen ^[1]; Gu, Zhiyong ^[3]

State Univ. of New York at Binghamton, Binghamton, NY (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Univ. of Massachusetts, Lowell, MA (United States)

The Cu–Sn metallurgical soldering reaction in two-segmented Cu–Sn nanowires is visualized by in-situ transmission electron microscopy. By varying the relative lengths of Cu and Sn segments, we show that the metallurgical reaction starts at ~ 200 ° with the formation of a Cu–Sn solid solution for the Sn/Cu length ratio smaller than 1:5 while the formation of Cu–Sn intermetallic compounds (IMCs) for larger Sn/Cu length ratios. Upon heating the nanowires up to ~ 500 °C, two phase transformation pathways occur, η-Cu₆Sn₅ → ε-Cu₃Sn → δ-Cu₄₁Sn₁₁ for nanowires with a long Cu segment and η-Cu₆Sn₅ → ε-Cu₃Sn → γ-Cu₃Sn with a short Cu segment. The dynamic in situ TEM visualization of the evolution of Kirkendall voids demonstrates that Cu diffuses faster both in Sn and IMCs than that of Sn in Cu₃ and IMCs, which is the underlying cause of the dependence of the IMC formation and associated phase evolution on the relative lengths of the Cu and Sn segments.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

OSTI ID:: 1193240

Report Number(s):: BNL--108171-2015-JA; KC040302

Journal Information:: Nanoscale, Journal Name: Nanoscale Journal Issue: 11 Vol. 7; ISSN NANOHL; ISSN 2040-3364

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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