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Title: Frontiers of in situ electron microscopy

Abstract

In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.

Authors:
 [1];  [2];  [3]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Univ. of California-San Diego, San Diego, CA (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1193214
Report Number(s):
BNL-108005-2015-JA
Journal ID: ISSN 0883-7694; R&D Project: MA015MACA; KC0201010
Grant/Contract Number:  
SC00112704
Resource Type:
Accepted Manuscript
Journal Name:
MRS Bulletin
Additional Journal Information:
Journal Volume: 40; Journal Issue: 01; Journal ID: ISSN 0883-7694
Publisher:
Materials Research Society
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; in situ transmission electron microscopy (TEM); environmental cell; nanoscale; catalytic; defects

Citation Formats

Zheng, Haimei, Zhu, Yimei, and Meng, Shirley Ying. Frontiers of in situ electron microscopy. United States: N. p., 2015. Web. doi:10.1557/mrs.2014.305.
Zheng, Haimei, Zhu, Yimei, & Meng, Shirley Ying. Frontiers of in situ electron microscopy. United States. doi:10.1557/mrs.2014.305.
Zheng, Haimei, Zhu, Yimei, and Meng, Shirley Ying. Thu . "Frontiers of in situ electron microscopy". United States. doi:10.1557/mrs.2014.305. https://www.osti.gov/servlets/purl/1193214.
@article{osti_1193214,
title = {Frontiers of in situ electron microscopy},
author = {Zheng, Haimei and Zhu, Yimei and Meng, Shirley Ying},
abstractNote = {In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.},
doi = {10.1557/mrs.2014.305},
journal = {MRS Bulletin},
number = 01,
volume = 40,
place = {United States},
year = {2015},
month = {1}
}

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