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Title: Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

Abstract

X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus' location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.

Authors:
 [1];  [1];  [1];  [2];  [3];  [1];  [1];  [1];  [1];  [4];  [4];  [4];  [4];  [4]
  1. SLAC National Accelerator Laboratory, Menlo Park, CA (United States)
  2. Germany
  3. Technische Universitat Dresden, Dresden (Germany)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
Contributing Org.:
Linac Coherent Light Source, SLAC National Accelerator Laboratory
OSTI Identifier:
1189927
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 22; Journal Issue: 3; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; X-ray; FEL; speckle; focusing

Citation Formats

Sikorski, Marcin, Song, Sanghoon, Schropp, Andreas, Deutsches Elektronen-Synchrotron, Hamburg, Seiboth, Frank, Feng, Yiping, Alonso-Mori, Roberto, Chollet, Matthieu, Lemke, Henrik T., Sokaras, Dimosthenis, Weng, Tsu-Chien, Zhang, Wenkai, Robert, Aymeric, and Zhu, Diling. Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis. United States: N. p., 2015. Web. doi:10.1107/S1600577515004361.
Sikorski, Marcin, Song, Sanghoon, Schropp, Andreas, Deutsches Elektronen-Synchrotron, Hamburg, Seiboth, Frank, Feng, Yiping, Alonso-Mori, Roberto, Chollet, Matthieu, Lemke, Henrik T., Sokaras, Dimosthenis, Weng, Tsu-Chien, Zhang, Wenkai, Robert, Aymeric, & Zhu, Diling. Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis. United States. https://doi.org/10.1107/S1600577515004361
Sikorski, Marcin, Song, Sanghoon, Schropp, Andreas, Deutsches Elektronen-Synchrotron, Hamburg, Seiboth, Frank, Feng, Yiping, Alonso-Mori, Roberto, Chollet, Matthieu, Lemke, Henrik T., Sokaras, Dimosthenis, Weng, Tsu-Chien, Zhang, Wenkai, Robert, Aymeric, and Zhu, Diling. Tue . "Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis". United States. https://doi.org/10.1107/S1600577515004361. https://www.osti.gov/servlets/purl/1189927.
@article{osti_1189927,
title = {Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis},
author = {Sikorski, Marcin and Song, Sanghoon and Schropp, Andreas and Deutsches Elektronen-Synchrotron, Hamburg and Seiboth, Frank and Feng, Yiping and Alonso-Mori, Roberto and Chollet, Matthieu and Lemke, Henrik T. and Sokaras, Dimosthenis and Weng, Tsu-Chien and Zhang, Wenkai and Robert, Aymeric and Zhu, Diling},
abstractNote = {X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus' location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.},
doi = {10.1107/S1600577515004361},
journal = {Journal of Synchrotron Radiation (Online)},
number = 3,
volume = 22,
place = {United States},
year = {Tue Apr 14 00:00:00 EDT 2015},
month = {Tue Apr 14 00:00:00 EDT 2015}
}

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Works referencing / citing this record:

Nanofocusing of X-ray free-electron laser using wavefront-corrected multilayer focusing mirrors
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Wavefront sensing at X-ray free-electron lasers
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SwissFEL: The Swiss X-ray Free Electron Laser
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Wavefront sensing at X-ray free-electron lasers
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