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Title: Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys

Abstract

This paper provides a general overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. In conclusion, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.

Authors:
 [1];  [1];  [2];  [3]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
  2. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
  3. Boise State Univ., ID (United States). Dept. of Materials Science and Engineering
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Office of Nuclear Energy (NE); USDOE Office of Science (SC), Biological and Environmental Research (BER) (SC-23)
OSTI Identifier:
1185692
Grant/Contract Number:  
AC05-00OR22725; 10-172; 10-678; 08-055; AC07-05ID14517
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Materials Research
Additional Journal Information:
Journal Volume: 30; Journal Issue: 9; Journal ID: ISSN 0884-2914
Publisher:
Materials Research Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; STEM; irradiation; Fe alloys; microscopy

Citation Formats

Parish, Chad M., Field, Kevin G., Certain, Alicia G., and Wharry, Janelle P. Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys. United States: N. p., 2015. Web. doi:10.1557/jmr.2015.32.
Parish, Chad M., Field, Kevin G., Certain, Alicia G., & Wharry, Janelle P. Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys. United States. doi:10.1557/jmr.2015.32.
Parish, Chad M., Field, Kevin G., Certain, Alicia G., and Wharry, Janelle P. Mon . "Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys". United States. doi:10.1557/jmr.2015.32. https://www.osti.gov/servlets/purl/1185692.
@article{osti_1185692,
title = {Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys},
author = {Parish, Chad M. and Field, Kevin G. and Certain, Alicia G. and Wharry, Janelle P.},
abstractNote = {This paper provides a general overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. In conclusion, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.},
doi = {10.1557/jmr.2015.32},
journal = {Journal of Materials Research},
number = 9,
volume = 30,
place = {United States},
year = {2015},
month = {4}
}

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Free Publicly Available Full Text
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Cited by: 9 works
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    Works referencing / citing this record:

    Automated defect analysis in electron microscopic images
    journal, July 2018