Error and uncertainty in Raman thermal conductivity measurements
Abstract
We investigated error and uncertainty in Raman thermal conductivity measurements via finite element based numerical simulation of two geometries often employed -- Joule-heating of a wire and laser-heating of a suspended wafer. Using this methodology, the accuracy and precision of the Raman-derived thermal conductivity are shown to depend on (1) assumptions within the analytical model used in the deduction of thermal conductivity, (2) uncertainty in the quantification of heat flux and temperature, and (3) the evolution of thermomechanical stress during testing. Apart from the influence of stress, errors of 5% coupled with uncertainties of ±15% are achievable for most materials under conditions typical of Raman thermometry experiments. Error can increase to >20%, however, for materials having highly temperature dependent thermal conductivities or, in some materials, when thermomechanical stress develops concurrent with the heating. A dimensionless parameter -- termed the Raman stress factor -- is derived to identify when stress effects will induce large levels of error. Together, the results compare the utility of Raman based conductivity measurements relative to more established techniques while at the same time identifying situations where its use is most efficacious.
- Authors:
-
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Georgia Inst. of Technology, Atlanta, GA (United States)
- Georgia Inst. of Technology, Atlanta, GA (United States)
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1185029
- Alternate Identifier(s):
- OSTI ID: 1228149
- Report Number(s):
- SAND-2014-20695J
Journal ID: ISSN 0034-6748; 553932
- Grant/Contract Number:
- AC04-94AL85000
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 86; Journal Issue: 4; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; thermal conductivity; temperature measurement; error analysis; thermal models; graphene
Citation Formats
Thomas Edwin Beechem, Yates, Luke, and Graham, Samuel. Error and uncertainty in Raman thermal conductivity measurements. United States: N. p., 2015.
Web. doi:10.1063/1.4918623.
Thomas Edwin Beechem, Yates, Luke, & Graham, Samuel. Error and uncertainty in Raman thermal conductivity measurements. United States. https://doi.org/10.1063/1.4918623
Thomas Edwin Beechem, Yates, Luke, and Graham, Samuel. Wed .
"Error and uncertainty in Raman thermal conductivity measurements". United States. https://doi.org/10.1063/1.4918623. https://www.osti.gov/servlets/purl/1185029.
@article{osti_1185029,
title = {Error and uncertainty in Raman thermal conductivity measurements},
author = {Thomas Edwin Beechem and Yates, Luke and Graham, Samuel},
abstractNote = {We investigated error and uncertainty in Raman thermal conductivity measurements via finite element based numerical simulation of two geometries often employed -- Joule-heating of a wire and laser-heating of a suspended wafer. Using this methodology, the accuracy and precision of the Raman-derived thermal conductivity are shown to depend on (1) assumptions within the analytical model used in the deduction of thermal conductivity, (2) uncertainty in the quantification of heat flux and temperature, and (3) the evolution of thermomechanical stress during testing. Apart from the influence of stress, errors of 5% coupled with uncertainties of ±15% are achievable for most materials under conditions typical of Raman thermometry experiments. Error can increase to >20%, however, for materials having highly temperature dependent thermal conductivities or, in some materials, when thermomechanical stress develops concurrent with the heating. A dimensionless parameter -- termed the Raman stress factor -- is derived to identify when stress effects will induce large levels of error. Together, the results compare the utility of Raman based conductivity measurements relative to more established techniques while at the same time identifying situations where its use is most efficacious.},
doi = {10.1063/1.4918623},
journal = {Review of Scientific Instruments},
number = 4,
volume = 86,
place = {United States},
year = {Wed Apr 22 00:00:00 EDT 2015},
month = {Wed Apr 22 00:00:00 EDT 2015}
}
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