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Title: First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces

Abstract

A first-principles approach is demonstrated for calculating the relationship between an aqueous semiconductor interface structure and energy level alignment. The physical interface structure is sampled using density functional theory based molecular dynamics, yielding the interface electrostatic dipole. The GW approach from many-body perturbation theory is used to place the electronic band edge energies of the semiconductor relative to the occupied 1b₁ energy level in water. The application to the specific cases of nonpolar (101¯0 ) facets of GaN and ZnO reveals a significant role for the structural motifs at the interface, including the degree of interface water dissociation and the dynamical fluctuations in the interface Zn-O and O-H bond orientations. As a result, these effects contribute up to 0.5 eV.

Authors:
 [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1182496
Alternate Identifier(s):
OSTI ID: 1181615
Report Number(s):
BNL-107392-2015-JA
Journal ID: ISSN 0031-9007; PRLTAO; R&D Project: CO045; KC0301020
Grant/Contract Number:  
SC00112704; AC02-98CH10886; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 113; Journal Issue: 17; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Kharche, Neerav, Muckerman, James T., and Hybertsen, Mark S. First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces. United States: N. p., 2014. Web. doi:10.1103/PhysRevLett.113.176802.
Kharche, Neerav, Muckerman, James T., & Hybertsen, Mark S. First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces. United States. https://doi.org/10.1103/PhysRevLett.113.176802
Kharche, Neerav, Muckerman, James T., and Hybertsen, Mark S. Tue . "First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces". United States. https://doi.org/10.1103/PhysRevLett.113.176802. https://www.osti.gov/servlets/purl/1182496.
@article{osti_1182496,
title = {First-principles approach to calculating energy level alignment at aqueous semiconductor interfaces},
author = {Kharche, Neerav and Muckerman, James T. and Hybertsen, Mark S.},
abstractNote = {A first-principles approach is demonstrated for calculating the relationship between an aqueous semiconductor interface structure and energy level alignment. The physical interface structure is sampled using density functional theory based molecular dynamics, yielding the interface electrostatic dipole. The GW approach from many-body perturbation theory is used to place the electronic band edge energies of the semiconductor relative to the occupied 1b₁ energy level in water. The application to the specific cases of nonpolar (101¯0 ) facets of GaN and ZnO reveals a significant role for the structural motifs at the interface, including the degree of interface water dissociation and the dynamical fluctuations in the interface Zn-O and O-H bond orientations. As a result, these effects contribute up to 0.5 eV.},
doi = {10.1103/PhysRevLett.113.176802},
journal = {Physical Review Letters},
number = 17,
volume = 113,
place = {United States},
year = {Tue Oct 21 00:00:00 EDT 2014},
month = {Tue Oct 21 00:00:00 EDT 2014}
}

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Cited by: 66 works
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