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Title: Reabsorption of Soft X-Ray Emission at High X-Ray Free-Electron Laser Fluences

Authors:
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Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 113 Journal Issue: 15; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1180829

Schreck, Simon, Beye, Martin, Sellberg, Jonas A., McQueen, Trevor, Laksmono, Hartawan, Kennedy, Brian, Eckert, Sebastian, Schlesinger, Daniel, Nordlund, Dennis, Ogasawara, Hirohito, Sierra, Raymond G., Segtnan, Vegard H., Kubicek, Katharina, Schlotter, William F., Dakovski, Georgi L., Moeller, Stefan P., Bergmann, Uwe, Techert, Simone, Pettersson, Lars G. M., Wernet, Philippe, Bogan, Michael J., Harada, Yoshihisa, Nilsson, Anders, and Föhlisch, Alexander. Reabsorption of Soft X-Ray Emission at High X-Ray Free-Electron Laser Fluences. United States: N. p., Web. doi:10.1103/PhysRevLett.113.153002.
Schreck, Simon, Beye, Martin, Sellberg, Jonas A., McQueen, Trevor, Laksmono, Hartawan, Kennedy, Brian, Eckert, Sebastian, Schlesinger, Daniel, Nordlund, Dennis, Ogasawara, Hirohito, Sierra, Raymond G., Segtnan, Vegard H., Kubicek, Katharina, Schlotter, William F., Dakovski, Georgi L., Moeller, Stefan P., Bergmann, Uwe, Techert, Simone, Pettersson, Lars G. M., Wernet, Philippe, Bogan, Michael J., Harada, Yoshihisa, Nilsson, Anders, & Föhlisch, Alexander. Reabsorption of Soft X-Ray Emission at High X-Ray Free-Electron Laser Fluences. United States. doi:10.1103/PhysRevLett.113.153002.
Schreck, Simon, Beye, Martin, Sellberg, Jonas A., McQueen, Trevor, Laksmono, Hartawan, Kennedy, Brian, Eckert, Sebastian, Schlesinger, Daniel, Nordlund, Dennis, Ogasawara, Hirohito, Sierra, Raymond G., Segtnan, Vegard H., Kubicek, Katharina, Schlotter, William F., Dakovski, Georgi L., Moeller, Stefan P., Bergmann, Uwe, Techert, Simone, Pettersson, Lars G. M., Wernet, Philippe, Bogan, Michael J., Harada, Yoshihisa, Nilsson, Anders, and Föhlisch, Alexander. 2014. "Reabsorption of Soft X-Ray Emission at High X-Ray Free-Electron Laser Fluences". United States. doi:10.1103/PhysRevLett.113.153002.
@article{osti_1180829,
title = {Reabsorption of Soft X-Ray Emission at High X-Ray Free-Electron Laser Fluences},
author = {Schreck, Simon and Beye, Martin and Sellberg, Jonas A. and McQueen, Trevor and Laksmono, Hartawan and Kennedy, Brian and Eckert, Sebastian and Schlesinger, Daniel and Nordlund, Dennis and Ogasawara, Hirohito and Sierra, Raymond G. and Segtnan, Vegard H. and Kubicek, Katharina and Schlotter, William F. and Dakovski, Georgi L. and Moeller, Stefan P. and Bergmann, Uwe and Techert, Simone and Pettersson, Lars G. M. and Wernet, Philippe and Bogan, Michael J. and Harada, Yoshihisa and Nilsson, Anders and Föhlisch, Alexander},
abstractNote = {},
doi = {10.1103/PhysRevLett.113.153002},
journal = {Physical Review Letters},
number = 15,
volume = 113,
place = {United States},
year = {2014},
month = {10}
}