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Title: Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 90; Journal Issue: 24; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1179887

Gann, Eliot, Watson, Anne, Tumbleston, John R., Cochran, Justin, Yan, Hongping, Wang, Cheng, Seok, Jaewook, Chabinyc, Michael, and Ade, Harald. Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique. United States: N. p., Web. doi:10.1103/PhysRevB.90.245421.
Gann, Eliot, Watson, Anne, Tumbleston, John R., Cochran, Justin, Yan, Hongping, Wang, Cheng, Seok, Jaewook, Chabinyc, Michael, & Ade, Harald. Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique. United States. doi:10.1103/PhysRevB.90.245421.
Gann, Eliot, Watson, Anne, Tumbleston, John R., Cochran, Justin, Yan, Hongping, Wang, Cheng, Seok, Jaewook, Chabinyc, Michael, and Ade, Harald. 2014. "Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique". United States. doi:10.1103/PhysRevB.90.245421.
@article{osti_1179887,
title = {Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique},
author = {Gann, Eliot and Watson, Anne and Tumbleston, John R. and Cochran, Justin and Yan, Hongping and Wang, Cheng and Seok, Jaewook and Chabinyc, Michael and Ade, Harald},
abstractNote = {},
doi = {10.1103/PhysRevB.90.245421},
journal = {Physical Review B},
number = 24,
volume = 90,
place = {United States},
year = {2014},
month = {12}
}