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Title: X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells

Abstract

The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. But, it has not been widely investigated how functional materials respond to the brilliant X-rays. Here, we report the X-ray-induced reversible resistance change in 40-nm-thick TiO2 films sandwiched by Pt top and bottom electrodes, and propose the physical mechanism behind the emergent phenomenon. Our findings indicate that there exists a photovoltaic-like effect, which modulates the resistance reversibly by a few orders of magnitude, depending on the intensity of impinging X-rays. Furthermore, we found that this effect, combined with the X-ray irradiation induced phase transition confirmed by transmission electron microscopy, triggers a nonvolatile reversible resistance change. In understanding X-ray-controlled reversible resistance changes we can provide possibilities to control initial resistance states of functional materials, which could be useful for future information and energy storage devices.

Authors:
; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1167143
Alternate Identifier(s):
OSTI ID: 1357574
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Published Article
Journal Name:
ACS Nano
Additional Journal Information:
Journal Name: ACS Nano Journal Volume: 8 Journal Issue: 2; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Joule heating; Magnéli phase; X-ray irradiation; defect generation; photovoltaic effect; resistive switching

Citation Formats

Chang, Seo Hyoung, Kim, Jungho, Phatak, Charudatta, D’Aquila, Kenneth, Kim, Seong Keun, Kim, Jiyoon, Song, Seul Ji, Hwang, Cheol Seong, Eastman, Jeffrey A., Freeland, John W., and Hong, Seungbum. X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells. United States: N. p., 2014. Web. doi:10.1021/nn405867p.
Chang, Seo Hyoung, Kim, Jungho, Phatak, Charudatta, D’Aquila, Kenneth, Kim, Seong Keun, Kim, Jiyoon, Song, Seul Ji, Hwang, Cheol Seong, Eastman, Jeffrey A., Freeland, John W., & Hong, Seungbum. X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells. United States. https://doi.org/10.1021/nn405867p
Chang, Seo Hyoung, Kim, Jungho, Phatak, Charudatta, D’Aquila, Kenneth, Kim, Seong Keun, Kim, Jiyoon, Song, Seul Ji, Hwang, Cheol Seong, Eastman, Jeffrey A., Freeland, John W., and Hong, Seungbum. Tue . "X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells". United States. https://doi.org/10.1021/nn405867p.
@article{osti_1167143,
title = {X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO 2 /Pt Cells},
author = {Chang, Seo Hyoung and Kim, Jungho and Phatak, Charudatta and D’Aquila, Kenneth and Kim, Seong Keun and Kim, Jiyoon and Song, Seul Ji and Hwang, Cheol Seong and Eastman, Jeffrey A. and Freeland, John W. and Hong, Seungbum},
abstractNote = {The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. But, it has not been widely investigated how functional materials respond to the brilliant X-rays. Here, we report the X-ray-induced reversible resistance change in 40-nm-thick TiO2 films sandwiched by Pt top and bottom electrodes, and propose the physical mechanism behind the emergent phenomenon. Our findings indicate that there exists a photovoltaic-like effect, which modulates the resistance reversibly by a few orders of magnitude, depending on the intensity of impinging X-rays. Furthermore, we found that this effect, combined with the X-ray irradiation induced phase transition confirmed by transmission electron microscopy, triggers a nonvolatile reversible resistance change. In understanding X-ray-controlled reversible resistance changes we can provide possibilities to control initial resistance states of functional materials, which could be useful for future information and energy storage devices.},
doi = {10.1021/nn405867p},
journal = {ACS Nano},
number = 2,
volume = 8,
place = {United States},
year = {Tue Feb 25 00:00:00 EST 2014},
month = {Tue Feb 25 00:00:00 EST 2014}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1021/nn405867p

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Cited by: 30 works
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