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Title: Incorrect support and missing center tolerances of phasing algorithms

Journal Article · · Optics Express
 [1];  [2];  [3];  [4];  [2];  [5]
  1. Stony Brook Univ., Stony Brook, NY (United States); Univ. College London (United Kingdom); Argonne National Laboratory
  2. Stony Brook Univ., Stony Brook, NY (United States)
  3. Stony Brook Univ., Stony Brook, NY (United States); Max Planck Institute for Medical Research, Heidelberg (Germany)
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. Stony Brook Univ., Stony Brook, NY (United States); Northwestern Univ., Evanston, IL (United States); Argonne National Lab., Argonne, IL (United States)
+ Show Author Affiliations

In x-ray diffraction microscopy, iterative algorithms retrieve reciprocal space phase information, and a real space image, from an object's coherent diffraction intensities through the use of a priori information such as a finite support constraint. In many experiments, the object's shape or support is not well known, and the diffraction pattern is incompletely measured. We describe here computer simulations to look at the effects of both of these possible errors when using several common reconstruction algorithms. Overly tight object supports prevent successful convergence; however, we show that this can often be recognized through pathological behavior of the phase retrieval transfer function. Dynamic range limitations often make it difficult to record the central speckles of the diffraction pattern. We show that this leads to increasing artifacts in the image when the number of missing central speckles exceeds about 10, and that the removal of unconstrained modes from the reconstructed image is helpful only when the number of missing central speckles is less than about 50. In conclusion, this simulation study helps in judging the reconstructability of experimentally recorded coherent diffraction patterns.

Research Organization:
Stony Brook Univ., Stony Brook, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
FG02-04ER46128
OSTI ID:
1165053
Report Number(s):
DOE-RFSUNY--46128
Journal Information:
Optics Express, Journal Name: Optics Express Journal Issue: 25 Vol. 18; ISSN 1094-4087; ISSN OPEXFF
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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Cited By (5)

X-ray Microscopy book January 2019
Signal enhancement and Patterson-search phasing for high-spatial-resolution coherent X-ray diffraction imaging of biological objects journal January 2015
X-ray microscopy journal July 1965
Femtosecond dark-field imaging with an X-ray free electron laser journal January 2012
X-ray microscopy journal February 2017

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36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
X-ray imaging
diffraction
image reconstruction techniques
noise in imaging systems