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Title: Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

Abstract

Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution images using fewer photons. As a result, this can be an important advantage for studying radiation-sensitive biological and soft matter specimens.

Authors:
 [1];  [1];  [1];  [1];  [2];  [1];  [1];  [1]
  1. Stony Brook Univ., Stony Brook, NY (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Stony Brook Univ., Stony Brook, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1164146
Grant/Contract Number:  
FG02-04ER46128
Resource Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 17; Journal Issue: 16; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray imaging; diffraction; image reconstruction techniques; noise in imaging systems

Citation Formats

Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, and Jacobsen, Chris. Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy. United States: N. p., 2009. Web. doi:10.1364/OE.17.013541.
Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, & Jacobsen, Chris. Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy. United States. doi:10.1364/OE.17.013541.
Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, and Jacobsen, Chris. Thu . "Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy". United States. doi:10.1364/OE.17.013541. https://www.osti.gov/servlets/purl/1164146.
@article{osti_1164146,
title = {Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy},
author = {Huang, Xiaojing and Miao, Huijie and Steinbrener, Jan and Nelson, Johanna and Shapiro, David and Stewart, Andrew and Turner, Joshua and Jacobsen, Chris},
abstractNote = {Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution images using fewer photons. As a result, this can be an important advantage for studying radiation-sensitive biological and soft matter specimens.},
doi = {10.1364/OE.17.013541},
journal = {Optics Express},
number = 16,
volume = 17,
place = {United States},
year = {2009},
month = {1}
}

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Cited by: 33 works
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    Works referencing / citing this record:

    Three-dimensional structure of a single colloidal crystal grain studied by coherent x-ray diffraction
    journal, January 2012

    • Gulden, J.; Yefanov, O. M.; Mancuso, A. P.
    • Optics Express, Vol. 20, Issue 4
    • DOI: 10.1364/oe.20.004039