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Title: Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1103874
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 110 Journal Issue: 11; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., and Wark, J. S. Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction. United States: N. p., 2013. Web. doi:10.1103/PhysRevLett.110.115501.
Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., & Wark, J. S. Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction. United States. doi:10.1103/PhysRevLett.110.115501.
Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., and Wark, J. S. Mon . "Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction". United States. doi:10.1103/PhysRevLett.110.115501.
@article{osti_1103874,
title = {Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction},
author = {Comley, A. J. and Maddox, B. R. and Rudd, R. E. and Prisbrey, S. T. and Hawreliak, J. A. and Orlikowski, D. A. and Peterson, S. C. and Satcher, J. H. and Elsholz, A. J. and Park, H. -S. and Remington, B. A. and Bazin, N. and Foster, J. M. and Graham, P. and Park, N. and Rosen, P. A. and Rothman, S. R. and Higginbotham, A. and Suggit, M. and Wark, J. S.},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.115501},
journal = {Physical Review Letters},
number = 11,
volume = 110,
place = {United States},
year = {2013},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.110.115501

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Cited by: 27 works
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