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Title: Revisiting Properties of Ferroelectric and Multiferroic Thin Films under Tensile Strain from First Principles

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1103049
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 109; Journal Issue: 5; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Yang, Yurong, Ren, Wei, Stengel, Massimiliano, Yan, X. H., and Bellaiche, L. Revisiting Properties of Ferroelectric and Multiferroic Thin Films under Tensile Strain from First Principles. United States: N. p., 2012. Web. doi:10.1103/PhysRevLett.109.057602.
Yang, Yurong, Ren, Wei, Stengel, Massimiliano, Yan, X. H., & Bellaiche, L. Revisiting Properties of Ferroelectric and Multiferroic Thin Films under Tensile Strain from First Principles. United States. doi:10.1103/PhysRevLett.109.057602.
Yang, Yurong, Ren, Wei, Stengel, Massimiliano, Yan, X. H., and Bellaiche, L. Thu . "Revisiting Properties of Ferroelectric and Multiferroic Thin Films under Tensile Strain from First Principles". United States. doi:10.1103/PhysRevLett.109.057602.
@article{osti_1103049,
title = {Revisiting Properties of Ferroelectric and Multiferroic Thin Films under Tensile Strain from First Principles},
author = {Yang, Yurong and Ren, Wei and Stengel, Massimiliano and Yan, X. H. and Bellaiche, L.},
abstractNote = {},
doi = {10.1103/PhysRevLett.109.057602},
journal = {Physical Review Letters},
number = 5,
volume = 109,
place = {United States},
year = {2012},
month = {8}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.109.057602

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Cited by: 47 works
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