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Title: Universal Features of Counting Statistics of Thermal and Quantum Phase Slips in Nanosize Superconducting Circuits

Authors:
; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1102838
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 24; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Murphy, A., Weinberg, P., Aref, T., Coskun, U. C., Vakaryuk, V., Levchenko, A., and Bezryadin, A. Universal Features of Counting Statistics of Thermal and Quantum Phase Slips in Nanosize Superconducting Circuits. United States: N. p., 2013. Web. doi:10.1103/PhysRevLett.110.247001.
Murphy, A., Weinberg, P., Aref, T., Coskun, U. C., Vakaryuk, V., Levchenko, A., & Bezryadin, A. Universal Features of Counting Statistics of Thermal and Quantum Phase Slips in Nanosize Superconducting Circuits. United States. doi:10.1103/PhysRevLett.110.247001.
Murphy, A., Weinberg, P., Aref, T., Coskun, U. C., Vakaryuk, V., Levchenko, A., and Bezryadin, A. Tue . "Universal Features of Counting Statistics of Thermal and Quantum Phase Slips in Nanosize Superconducting Circuits". United States. doi:10.1103/PhysRevLett.110.247001.
@article{osti_1102838,
title = {Universal Features of Counting Statistics of Thermal and Quantum Phase Slips in Nanosize Superconducting Circuits},
author = {Murphy, A. and Weinberg, P. and Aref, T. and Coskun, U. C. and Vakaryuk, V. and Levchenko, A. and Bezryadin, A.},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.247001},
journal = {Physical Review Letters},
number = 24,
volume = 110,
place = {United States},
year = {2013},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.110.247001

Citation Metrics:
Cited by: 8 works
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