Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Liu, Y.; Wang, H. -H.; Bian, G.; Zhang, Z.; Lee, S. S.; Fenter, P. A.; Tischler, J. Z.; Hong, H.; Chiang, T. -C.

doi:10.1103/PhysRevLett.110.226103

Title: Interfacial Bonding and Structure of ${Bi}_{2} {Te}_{3}$ Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

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Authors:: Liu, Y.; Wang, H. -H.; Bian, G.; Zhang, Z.; Lee, S. S.; Fenter, P. A.; Tischler, J. Z.; Hong, H.; Chiang, T. -C.

Publication Date:: 2013-05-30

Sponsoring Org.:: USDOE

OSTI Identifier:: 1102772

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review Letters

Additional Journal Information:: Journal Name: Physical Review Letters Journal Volume: 110 Journal Issue: 22; Journal ID: ISSN 0031-9007

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

Citation Formats


                    Liu, Y., Wang, H. -H., Bian, G., Zhang, Z., Lee, S. S., Fenter, P. A., Tischler, J. Z., Hong, H., and Chiang, T. -C. Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering.  United States: N. p., 2013. 
Web.  doi:10.1103/PhysRevLett.110.226103.

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                    Liu, Y., Wang, H. -H., Bian, G., Zhang, Z., Lee, S. S., Fenter, P. A., Tischler, J. Z., Hong, H., & Chiang, T. -C. Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering.  United States.  https://doi.org/10.1103/PhysRevLett.110.226103

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                    Liu, Y., Wang, H. -H., Bian, G., Zhang, Z., Lee, S. S., Fenter, P. A., Tischler, J. Z., Hong, H., and Chiang, T. -C. Thu .  
"Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering".  United States.  https://doi.org/10.1103/PhysRevLett.110.226103.

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@article{osti_1102772,

  title        = {Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering},

  author       = {Liu, Y. and Wang, H. -H. and Bian, G. and Zhang, Z. and Lee, S. S. and Fenter, P. A. and Tischler, J. Z. and Hong, H. and Chiang, T. -C.},

  abstractNote = {},

  doi          = {10.1103/PhysRevLett.110.226103},

  journal      = {Physical Review Letters},

  number       = 22,

  volume       = 110,

  place        = {United States},

  year         = {2013},

  month        = {5}

}

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Title: Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Citation Formats

Title: Interfacial Bonding and Structure of ${Bi}_{2} {Te}_{3}$ Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering