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Title: Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 22; Related Information: CHORUS Timestamp: 2016-12-23 05:02:50; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1102772
Alternate Identifier(s):
OSTI ID: 1102772