Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Title: Interfacial Bonding and Structure of ${Bi}_{2} {Te}_{3}$ Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Journal Article · 30 May 2013 · Physical Review Letters

DOI: https://doi.org/10.1103/PhysRevLett.110.226103 · OSTI ID:1102772

Liu, Y.; Wang, H. -H.; Bian, G.; Zhang, Z.; Lee, S. S.; Fenter, P. A.; Tischler, J. Z.; Hong, H.; Chiang, T. -C.

Cite

Export

Save

Journal Information:: Physical Review Letters, Journal Name: Physical Review Letters Vol. 110 Journal Issue: 22; ISSN 0031-9007

Citation Metrics:

Cited by: 7 works

Citation information provided by
Web of Science

Connecting Thermoelectric Performance and Topological-Insulator Behavior:

{Bi}_{2} {Te}_{3}

{Bi}_{2} {Te}_{2} Se

Journal Article · 2015 · Physical Review Applied · OSTI ID:1385301

Shi, Hongliang; Parker, David; Du, Mao-Hua; +1 more

{({Bi}_{1 - x} {Sb}_{x})}_{2} {Te}_{3}

Journal Article · 2020 · Physical Review Letters · OSTI ID:1633111

Hlevyack, Joseph A.; Najafzadeh, Sahand; Lin, Meng-Kai; +15 more

{Bi}_{2} {Te}_{3}

Journal Article · 2015 · Physical Review Letters · OSTI ID:1198574

Xu, C. -Z.; Liu, Y.; Yukawa, R.; +4 more