Interfacial Bonding and Structure of Bi 2 Te 3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Title: Interfacial Bonding and Structure of ${Bi}_{2} {Te}_{3}$ Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Journal Article · 29 May 2013 · Physical Review Letters

DOI: https://doi.org/10.1103/PhysRevLett.110.226103 · OSTI ID:1102772

Liu, Y.; Wang, H. -H.; Bian, G.; Zhang, Z.; Lee, S. S.; Fenter, P. A.; Tischler, J. Z.; Hong, H.; Chiang, T. -C.

Not Available

Cite

Export

Save

Journal Information:: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 22 Vol. 110; ISSN 0031-9007; ISSN PRLTAO

Photoemission Circular Dichroism and Spin Polarization of the Topological Surface States in Ultrathin

{Bi}_{2} {Te}_{3}

Journal Article · 2015 · Physical Review Letters · OSTI ID:1198574

Xu, C. -Z.; Liu, Y.; Yukawa, R.; +4 more

{Bi}_{0.91} {Sb}_{0.09}

Journal Article · 2013 · Physical Review Letters · OSTI ID:1245719

Qu, Dong-Xia; Roberts, Sarah K.; Chapline, George F.

{Bi}_{2} {Te}_{3}

Journal Article · 2013 · Physical Review Letters · OSTI ID:1102729

Scholz, M. R.; Sánchez-Barriga, J.; Braun, J.; +11 more