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Title: Inelastic neutron scattering study of phonon density of states in nanostructured Si 1 x Ge x thermoelectrics

Authors:
; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1102537
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 86; Journal Issue: 21; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Dhital, Chetan, Abernathy, D. L., Zhu, Gaohua, Ren, Zhifeng, Broido, D., and Wilson, Stephen D. Inelastic neutron scattering study of phonon density of states in nanostructured Si 1 − x Ge x thermoelectrics. United States: N. p., 2012. Web. doi:10.1103/PhysRevB.86.214303.
Dhital, Chetan, Abernathy, D. L., Zhu, Gaohua, Ren, Zhifeng, Broido, D., & Wilson, Stephen D. Inelastic neutron scattering study of phonon density of states in nanostructured Si 1 − x Ge x thermoelectrics. United States. doi:10.1103/PhysRevB.86.214303.
Dhital, Chetan, Abernathy, D. L., Zhu, Gaohua, Ren, Zhifeng, Broido, D., and Wilson, Stephen D. Mon . "Inelastic neutron scattering study of phonon density of states in nanostructured Si 1 − x Ge x thermoelectrics". United States. doi:10.1103/PhysRevB.86.214303.
@article{osti_1102537,
title = {Inelastic neutron scattering study of phonon density of states in nanostructured Si 1 − x Ge x thermoelectrics},
author = {Dhital, Chetan and Abernathy, D. L. and Zhu, Gaohua and Ren, Zhifeng and Broido, D. and Wilson, Stephen D.},
abstractNote = {},
doi = {10.1103/PhysRevB.86.214303},
journal = {Physical Review B},
number = 21,
volume = 86,
place = {United States},
year = {2012},
month = {12}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevB.86.214303

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Cited by: 4 works
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