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Title: Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1102151
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 17; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., and Weisbuch, Claude. Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop. United States: N. p., 2013. Web. doi:10.1103/PhysRevLett.110.177406.
Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., & Weisbuch, Claude. Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop. United States. doi:10.1103/PhysRevLett.110.177406.
Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., and Weisbuch, Claude. Thu . "Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop". United States. doi:10.1103/PhysRevLett.110.177406.
@article{osti_1102151,
title = {Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop},
author = {Iveland, Justin and Martinelli, Lucio and Peretti, Jacques and Speck, James S. and Weisbuch, Claude},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.177406},
journal = {Physical Review Letters},
number = 17,
volume = 110,
place = {United States},
year = {2013},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.110.177406

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Cited by: 316 works
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