Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

Iveland, Justin; Martinelli, Lucio; Peretti, Jacques; Speck, James S.; Weisbuch, Claude

doi:10.1103/PhysRevLett.110.177406

Title: Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

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Authors:: Iveland, Justin; Martinelli, Lucio; Peretti, Jacques; Speck, James S.; Weisbuch, Claude

Publication Date:: 2013-04-25

Sponsoring Org.:: USDOE

OSTI Identifier:: 1102151

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review Letters

Additional Journal Information:: Journal Volume: 110; Journal Issue: 17; Journal ID: ISSN 0031-9007

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

Citation Formats


                    Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., and Weisbuch, Claude. Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop.  United States: N. p., 2013. 
Web.  doi:10.1103/PhysRevLett.110.177406.

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                    Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., & Weisbuch, Claude. Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop.  United States.  https://doi.org/10.1103/PhysRevLett.110.177406

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                    Iveland, Justin, Martinelli, Lucio, Peretti, Jacques, Speck, James S., and Weisbuch, Claude. Thu .  
"Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop".  United States.  https://doi.org/10.1103/PhysRevLett.110.177406.

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@article{osti_1102151,

  title        = {Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop},

  author       = {Iveland, Justin and Martinelli, Lucio and Peretti, Jacques and Speck, James S. and Weisbuch, Claude},

  abstractNote = {},

  doi          = {10.1103/PhysRevLett.110.177406},

  journal      = {Physical Review Letters},

  number       = 17,

  volume       = 110,

  place        = {United States},

  year         = {2013},

  month        = {4}

}

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Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

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