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Title: Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon 1 s Absorption Edge

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1102123
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 17; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Yan, Hongping, Wang, Cheng, McCarn, Allison R., and Ade, Harald. Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon 1 s Absorption Edge. United States: N. p., 2013. Web. doi:10.1103/PhysRevLett.110.177401.
Yan, Hongping, Wang, Cheng, McCarn, Allison R., & Ade, Harald. Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon 1 s Absorption Edge. United States. doi:10.1103/PhysRevLett.110.177401.
Yan, Hongping, Wang, Cheng, McCarn, Allison R., and Ade, Harald. Tue . "Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon 1 s Absorption Edge". United States. doi:10.1103/PhysRevLett.110.177401.
@article{osti_1102123,
title = {Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon 1 s Absorption Edge},
author = {Yan, Hongping and Wang, Cheng and McCarn, Allison R. and Ade, Harald},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.177401},
journal = {Physical Review Letters},
number = 17,
volume = 110,
place = {United States},
year = {2013},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.110.177401

Citation Metrics:
Cited by: 16 works
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