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Title: Optical Probing of Ultrafast Electronic Decay in Bi and Sb with Slow Phonons

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1101960
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 4; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Li, J. J., Chen, J., Reis, D. A., Fahy, S., and Merlin, R. Optical Probing of Ultrafast Electronic Decay in Bi and Sb with Slow Phonons. United States: N. p., 2013. Web. doi:10.1103/PhysRevLett.110.047401.
Li, J. J., Chen, J., Reis, D. A., Fahy, S., & Merlin, R. Optical Probing of Ultrafast Electronic Decay in Bi and Sb with Slow Phonons. United States. https://doi.org/10.1103/PhysRevLett.110.047401
Li, J. J., Chen, J., Reis, D. A., Fahy, S., and Merlin, R. Thu . "Optical Probing of Ultrafast Electronic Decay in Bi and Sb with Slow Phonons". United States. https://doi.org/10.1103/PhysRevLett.110.047401.
@article{osti_1101960,
title = {Optical Probing of Ultrafast Electronic Decay in Bi and Sb with Slow Phonons},
author = {Li, J. J. and Chen, J. and Reis, D. A. and Fahy, S. and Merlin, R.},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.047401},
journal = {Physical Review Letters},
number = 4,
volume = 110,
place = {United States},
year = {Thu Jan 24 00:00:00 EST 2013},
month = {Thu Jan 24 00:00:00 EST 2013}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1103/PhysRevLett.110.047401

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Cited by: 49 works
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