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Title: Terminating Surface Electromigration at the Source

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1100223
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 15; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Bevan, Kirk H., Zhu, Wenguang, Guo, Hong, and Zhang, Zhenyu. Terminating Surface Electromigration at the Source. United States: N. p., 2011. Web. doi:10.1103/PhysRevLett.106.156404.
Bevan, Kirk H., Zhu, Wenguang, Guo, Hong, & Zhang, Zhenyu. Terminating Surface Electromigration at the Source. United States. doi:10.1103/PhysRevLett.106.156404.
Bevan, Kirk H., Zhu, Wenguang, Guo, Hong, and Zhang, Zhenyu. Wed . "Terminating Surface Electromigration at the Source". United States. doi:10.1103/PhysRevLett.106.156404.
@article{osti_1100223,
title = {Terminating Surface Electromigration at the Source},
author = {Bevan, Kirk H. and Zhu, Wenguang and Guo, Hong and Zhang, Zhenyu},
abstractNote = {},
doi = {10.1103/PhysRevLett.106.156404},
journal = {Physical Review Letters},
number = 15,
volume = 106,
place = {United States},
year = {2011},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.106.156404

Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

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