Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system

Zhan, Qing-feng; Zhang, Wei; Krishnan, Kannan M.

doi:10.1103/PhysRevB.83.094404

Title: Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system

Full Record
Other Related Research

Authors:: Zhan, Qing-feng; Zhang, Wei; Krishnan, Kannan M.

Publication Date:: Mon Mar 07 00:00:00 EST 2011

Sponsoring Org.:: USDOE

OSTI Identifier:: 1099994

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 83; Journal Issue: 9; Journal ID: ISSN 1098-0121

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

Citation Formats


                    Zhan, Qing-feng, Zhang, Wei, and Krishnan, Kannan M. Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system.  United States: N. p., 2011. 
Web.  doi:10.1103/PhysRevB.83.094404.

Copy to clipboard


                    Zhan, Qing-feng, Zhang, Wei, & Krishnan, Kannan M. Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system.  United States.  https://doi.org/10.1103/PhysRevB.83.094404

Copy to clipboard


                    Zhan, Qing-feng, Zhang, Wei, and Krishnan, Kannan M. Mon .  
"Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system".  United States.  https://doi.org/10.1103/PhysRevB.83.094404.

Copy to clipboard


                    
@article{osti_1099994,

  title        = {Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system},

  author       = {Zhan, Qing-feng and Zhang, Wei and Krishnan, Kannan M.},

  abstractNote = {},

  doi          = {10.1103/PhysRevB.83.094404},

  journal      = {Physical Review B},

  number       = 9,

  volume       = 83,

  place        = {United States},

  year         = {Mon Mar 07 00:00:00 EST 2011},

  month        = {Mon Mar 07 00:00:00 EST 2011}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (Publisher)

Publisher's Version of Record
https://doi.org/10.1103/PhysRevB.83.094404

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 36 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

Direct Imaging of Asymmetric Magnetization Reversal in Exchange-Biased Fe/MnPd Bilayers By X-Ray Photoemission Electron Microscopy

Journal Article Blomqvist, P ; Krishnan, K M ; /Washington U., Seattle ; ... - Phys.Rev.Lett.94:107203,2005

No abstract prepared.
Effect of antiferromagnetic layer thickness on exchange bias, training effect, and magnetotransport properties in ferromagnetic/antiferromagnetic antidot arrays

Journal Article Gong, W. J. ; Liu, W., E-mail: wliu@imr.ac.cn ; Feng, J. N. ; ... - Journal of Applied Physics

The effect of antiferromagnetic (AFM) layer on exchange bias (EB), training effect, and magnetotransport properties in ferromagnetic (FM) /AFM nanoscale antidot arrays and sheet films Ag(10 nm)/Co(8 nm)/NiO(t{sub NiO})/Ag(5 nm) at 10 K is studied. The AFM layer thickness dependence of the EB field shows a peak at t{sub NiO} = 2 nm that is explained by using the random field model. The misalignment of magnetic moments in the three-dimensional antidot arrays causes smaller decrease of EB field compared with that in the sheet films for training effect. The anomalous magnetotransport properties, in particular positive magnetoresistance (MR) for antidot arrays but negative MR for sheet films aremore »« less
https://doi.org/10.1063/1.4870285
Influence of the Thickness of the Ferro- and Antiferromagnetic Phases on Magnetic Properties in Epitaxial Heterostructures Based on Exchange Biased La-Ca-Mn-O System

Journal Article Gomez, Maria E. ; Campillo, Gloria E. ; Diez, Sandra ; ... - IEEE Transactions on Magnetics

Metal oxides show fascinating physical properties such as ferromagnetism, antiferromagnetism, high temperature superconductivity, ferroelectricity, or even multiferroicity. For many possible electronic applications as well as fundamental studies, it is essential to fabricate epitaxial layered films and multilayers of these materials having complex lattice structures with sharp interfaces, preserving epitaxiallity through the whole structure. We have grown these kind of oxide heterostructures on single crystal (001) oriented SrTiO3 substrates by using an in-situ DC sputtering technique at high oxygen pressures. Specifically, we report the study of magnetic and transport properties in ferromagnetic/antiferromagnetic, F/AF, heterostructures based on the Ca-doped lanthanum manganite system.more »« less
https://doi.org/10.1109/TMAG.2013.2257711
Effect of L1{sub 2} ordering in antiferromagnetic Ir-Mn epitaxial layer on exchange bias of FePd films

Journal Article Chang, Y. C. ; Duh, J. G., E-mail: pmami.hsiao@gmail.com, E-mail: lin.yg@nsrrc.org.tw, E-mail: jgd@mx.nthu.edu.tw ; Hsiao, S. N., E-mail: pmami.hsiao@gmail.com, E-mail: lin.yg@nsrrc.org.tw, E-mail: jgd@mx.nthu.edu.tw ; ... - Journal of Applied Physics

Two series of samples of single-layer IrMn and IrMn/FePd bilayer films, deposited on a single-crystal MgO substrate at different IrMn deposition temperatures (T{sub s} = 300–700 °C), were investigated using magnetron sputtering. L1{sub 2} ordering was revealed for the 30 nm-thick IrMn epitaxial (001) films with T{sub s} ≥ 400 °C, determined by synchrotron radiation x-ray diffractometry (XRD). XRD results also provide evidence of the epitaxial growth of the IrMn films on MgO substrate. Increasing T{sub s} from 400 to 700 °C monotonically increases the ordering parameter of L1{sub 2} phases from 0.17 to 0.81. An in-plane exchange bias field (H{sub eb}) of 22 Oe is obtained in amore »« less
https://doi.org/10.1063/1.4919232
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films

Journal Article Behler, Anna ; Department of Physics, Institute for Solid State Physics, Dresden University of Technology, 01062 Dresden ; Teichert, Niclas ; ... - AIP Advances

A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni{sub 50}Mn{sub 32}Sn{sub 18} thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.
https://doi.org/10.1063/1.4849795

Similar Records