Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1099754
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Name: Physical Review Letters Journal Volume: 107 Journal Issue: 3; Journal ID: ISSN 0031-9007
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Cai, Na, Zhou, Guangwen, Müller, Kathrin, and Starr, David E. Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure. United States: N. p., 2011.
Web. doi:10.1103/PhysRevLett.107.035502.
Cai, Na, Zhou, Guangwen, Müller, Kathrin, & Starr, David E. Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure. United States. https://doi.org/10.1103/PhysRevLett.107.035502
Cai, Na, Zhou, Guangwen, Müller, Kathrin, and Starr, David E. Mon .
"Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure". United States. https://doi.org/10.1103/PhysRevLett.107.035502.
@article{osti_1099754,
title = {Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure},
author = {Cai, Na and Zhou, Guangwen and Müller, Kathrin and Starr, David E.},
abstractNote = {},
doi = {10.1103/PhysRevLett.107.035502},
journal = {Physical Review Letters},
number = 3,
volume = 107,
place = {United States},
year = {Mon Jul 11 00:00:00 EDT 2011},
month = {Mon Jul 11 00:00:00 EDT 2011}
}
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https://doi.org/10.1103/PhysRevLett.107.035502
https://doi.org/10.1103/PhysRevLett.107.035502
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Cited by: 49 works
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Works referenced in this record:
Growth kinetics and mechanisms of aluminum-oxide films formed by thermal oxidation of aluminum
journal, August 2002
- Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, F. D.
- Journal of Applied Physics, Vol. 92, Issue 3
Atomistic Simulation of Field Enhanced Oxidation of Al (100) Beyond the Mott Potential
journal, March 2009
- Sankaranarayanan, Subramanian K. R. S.; Kaxiras, Efthimios; Ramanathan, Shriram
- Physical Review Letters, Vol. 102, Issue 9
Electron-stimulated oxidation of Al(111) by oxygen at low temperatures: Mechanism of enhanced oxidation kinetics
journal, April 2002
- Zhukov, V.; Popova, I.; Yates, J. T.
- Physical Review B, Vol. 65, Issue 19
Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS
journal, January 2002
- Snijders, P. C.; Jeurgens, L. P. H.; Sloof, W. G.
- Surface Science, Vol. 496, Issue 1-2
Electric Field Control of Surface Oxygen Dynamics and its Effect on the Atomic Scale Structure and Morphology of a Growing Ultrathin Oxide Film
journal, March 2010
- Sankaranarayanan, Subramanian K. R. S.; Ramanathan, Shriram
- The Journal of Physical Chemistry C, Vol. 114, Issue 14
Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication
journal, July 1997
- Avouris, Phaedon; Hertel, Tobias; Martel, Richard
- Applied Physics Letters, Vol. 71, Issue 2
Composition and chemical state of the ions of aluminium-oxide films formed by thermal oxidation of aluminium
journal, May 2002
- Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, F. D.
- Surface Science, Vol. 506, Issue 3
Photoelectron determination of the attenuation of low-energy electrons in
journal, April 1974
- Battye, F. L.; Jenkin, J. G.; Liesegang, J.
- Physical Review B, Vol. 9, Issue 7
Electrostatic Field Enhancement of Al(111) Oxidation
journal, December 2002
- Popova, I.; Zhukov, V.; Yates, J. T.
- Physical Review Letters, Vol. 89, Issue 27
Studies on optical and dielectric properties of Al2O3 thin films prepared by electron beam evaporation and spray pyrolysis method
journal, February 2004
- Shamala, K. S.; Murthy, L. C. S.; Narasimha Rao, K.
- Materials Science and Engineering: B, Vol. 106, Issue 3
Cabrera-Mott mechanism for oxidation of metals explains diffusion of metallic atoms through thin defective oxide layers
journal, November 1985
- Ocal, C.; Ferrer, S.; García, N.
- Surface Science, Vol. 163, Issue 2-3
Theory of the oxidation of metals
journal, January 1949
- Cabrera, N.; Mott, N. F.
- Reports on Progress in Physics, Vol. 12, Issue 1
Structure and morphology of aluminium-oxide films formed by thermal oxidation of aluminium
journal, October 2002
- Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, F. D.
- Thin Solid Films, Vol. 418, Issue 2
The effect of substrate orientation on the kinetics of ultra-thin oxide-film growth on Al single crystals
journal, July 2008
- Reichel, F.; Jeurgens, L. P. H.; Mittemeijer, E. J.
- Acta Materialia, Vol. 56, Issue 12
Electron-impact-induced oxidation of Al(111) in water vapor: Relation to the Cabrera-Mott mechanism
journal, January 1998
- Ebinger, H. D.; Yates, J. T.
- Physical Review B, Vol. 57, Issue 3
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
journal, October 1981
- Wagner, C. D.; Davis, L. E.; Zeller, M. V.
- Surface and Interface Analysis, Vol. 3, Issue 5
Thermodynamic stability of amorphous oxide films on metals: Application to aluminum oxide films on aluminum substrates
journal, August 2000
- Jeurgens, L.; Sloof, W.; Tichelaar, F.
- Physical Review B, Vol. 62, Issue 7
Electric field tuning of oxygen stoichiometry at oxide surfaces: molecular dynamics simulations studies of zirconia
journal, January 2009
- Sankaranarayanan, Subramanian K. R. S.; Kaxiras, Efthimios; Ramanathan, Shriram
- Energy & Environmental Science, Vol. 2, Issue 11