DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Interfacial Protection of Topological Surface States in Ultrathin Sb Films

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1098810
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 108 Journal Issue: 17; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Bian, Guang, Wang, Xiaoxiong, Liu, Yang, Miller, T., and Chiang, T. -C. Interfacial Protection of Topological Surface States in Ultrathin Sb Films. United States: N. p., 2012. Web. doi:10.1103/PhysRevLett.108.176401.
Bian, Guang, Wang, Xiaoxiong, Liu, Yang, Miller, T., & Chiang, T. -C. Interfacial Protection of Topological Surface States in Ultrathin Sb Films. United States. https://doi.org/10.1103/PhysRevLett.108.176401
Bian, Guang, Wang, Xiaoxiong, Liu, Yang, Miller, T., and Chiang, T. -C. Wed . "Interfacial Protection of Topological Surface States in Ultrathin Sb Films". United States. https://doi.org/10.1103/PhysRevLett.108.176401.
@article{osti_1098810,
title = {Interfacial Protection of Topological Surface States in Ultrathin Sb Films},
author = {Bian, Guang and Wang, Xiaoxiong and Liu, Yang and Miller, T. and Chiang, T. -C.},
abstractNote = {},
doi = {10.1103/PhysRevLett.108.176401},
journal = {Physical Review Letters},
number = 17,
volume = 108,
place = {United States},
year = {Wed Apr 25 00:00:00 EDT 2012},
month = {Wed Apr 25 00:00:00 EDT 2012}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1103/PhysRevLett.108.176401

Citation Metrics:
Cited by: 69 works
Citation information provided by
Web of Science

Save / Share: