Title:
DETERMINATION OF CRYSTAL LATTICE CONSTANTS WITH AN X-RAY SPECTROMETER
Subject Terms:
CRYSTAL STRUCTUREX-RAY SPECTROMETERS
Document Location:
DOE Public Reading Room - Hanford Battelle P.O. Box 999 MS H2-53 Richland WA 99352 (509)372-7443
Publication Date:
1962 Jun 13
Declassification Status:
Declassified
Accession Number:
RL-1-381869
Document Number(s):
HW-SA-2639
Originating Research Org.:
GE - HAPO
OpenNet Entry Date:
2004 Feb 24
OpenNet Modified Date:
2015 Aug 24
Description/Abstract:
DISCUSSES PRINCIPLES OF THE METHOD, DESCRIBES THE INSTRUMENTATION AND TECHNIQUES AND GIVES SOME RESULTS OBTAINED WITH UO2 AND ThO2. THE METHOD IS MUCH MORE RAPID THAN THE PHOTOGRAPHIC METHOD AND ALMOST AS PRECISE