DUNNING, G M [AEC-ATOMIC ENERGY COMMISSION, THE U.S.];
DUNHAM, C L [AEC-ATOMIC ENERGY COMMISSION, THE U.S.];
BARKHAU, H W [GENERAL ELECTRIC COMPANY];
LUERSEN, R B [GENERAL ELECTRIC COMPANY];
KOLDE, H E [GENERAL ELECTRIC COMPANY];
HOFFER, R F [GENERAL ELECTRIC COMPANY];
BALL, G J [AEC-ATOMIC ENERGY COMMISSION, THE U.S.];
WOMELSDUFF, R [SANDIA LABORATORY, SANDIA, NM];
JUSKIEWICZ, A [SANDIA LABORATORY, SANDIA, NM];
RARRICK, H [SANDIA LABORATORY, SANDIA, NM];
ABEE, H H [OAK RIDGE NATIONAL LABORATORY];
DAVIS, D M [OAK RIDGE NATIONAL LABORATORY];
UNK, [UNIVERSITY OF CALIFORNIA, BERKELEY];
GARDEN, N B [LAWRENCE RADIATION LABORATORY, U. OF CA];
MEADORS, O L [UNIVERSITY OF CALIFORNIA, BERKELEY];
TAXTER, M D [UNIVERSITY OF CALIFORNIA, BERKELEY];
MURROW, J R [UNIVERSITY OF CALIFORNIA, BERKELEY];
THAXTER, M D [UNIVERSITY OF CALIFORNIA, BERKELEY];
YOUNG, J [UNIVERSITY OF CALIFORNIA, BERKELEY];
SILVERMAN, L B [UNIVERSITY OF CALIFORNIA];
ROMNEY, E M [UNIVERSITY OF CALIFORNIA];
BORG, G [UNIVERSITY OF CALIFORNIA];
STREBE, F [UNIVERSITY OF CALIFORNIA];
MERMAGEN, H [UNIVERSITY OF ROCHESTER];
MAILLIE, D H [UNIVERSITY OF ROCHESTER]