Document Details
Title:
X-RAY PHOTOELECTRON SPECTROSCOPY SPUTTER DEPTH PROFILE ANALYSIS OF SPATIALLY CONTROLLED MICROSTRUCTURES IN CONDUCTIVE POLYMER FILMS (ANALYTICAL CHEMISTRY, VOL. 63, NO. 1, JAN 1, 1991)
Author(s):
MACKAY, S G [UNIVERSITY OF NORTH CAROLINA]; BAKIR, M [UNIVERSITY OF NORTH CAROLINA]; MUSSELMAN, I H [UNIVERSITY OF NORTH CAROLINA]; MEYER, T J [UNIVERSITY OF NORTH CAROLINA]; LINTON, R W [UNIVERSITY OF NORTH CAROLINA]
Document Location:
Location - DOE/NNSA NUCLEAR TESTING ARCHIVE Address - P.O. Box 98521 City - Las Vegas State - NV Zip - 89193-8521 Phone - (702)794-5106 Fax - (702)862-4240 Email - NTA@NV.DOE.GOV
Document Type:
OTHER
Document Type Other:
JOURNAL ARTICLE
Publication Date:
1991 Jan 01
Declassification Status:
Never classified
Document Pages:
0006
Accession Number:
NV0510370
OpenNet Entry Date:
2012 Dec 28
OpenNet Modified Date:
2012 Dec 27