Document Details


Title:
INTEGRATED X-RAY REFLECTIVITY MEASUREMENTS FOR ELLIPTICALLY CURVED PET CRYSTALS (CD-ROM)
Author(s):
HAUGH, M J; JACOBY, K D; ROSS, P W; REGAN, S P; MAGOON, J; SHOUP, M J; BARROS, M A [LAWRENCE LIVERMORE NATIONAL LABORATORY]; EMIG, J A [LAWRENCE LIVERMORE NATIONAL LABORATORY]; FOURNIER, K B [LAWRENCE LIVERMORE NATIONAL LABORATORY]
Document Location:
Location - NNSA/NSO Nuclear Testing Archive Address - P.O. Box 98521 City - Las Vegas State - NV Zip - 89193-8521 Phone - (702)794-5106 Fax - (702)862-4240 Email - CIC@NV.DOE.GOV
Document Type:
OTHER
Document Type Other:
SUMMARY
Publication Date:
2012 Jan 01
Declassification Status:
Never classified
Document Pages:
0001
Accession Number:
NV0340737
Document Number(s):
DOE/NV/25946-1500
Originating Research Org.:
NSTEC
OpenNet Entry Date:
2012 Dec 28


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