HREM investigations of edge Josephson junctions (EJJ) with PrBa[sub 2]Cu[sub 3]O[sub 7-x] barrier layer (PB) were performed. All layers (superconducting YBa[sub 2]Cu[sub 3]O[sub 7-x]) (Y1) and (Y2), insulating PrBa[sub 2]Cu[sub 3]O[sub 7-x] (PI) and barrier (PB) were obtained by laser ablation. The edges were formed by ion sputtering using a fotoresist mask. EJJ shows Josephson conductivity at Tc=77 K, giving j[sub c]=10[sup 4] A/cm[sup 2] at U[sub c]=50 [mu]V. Cross-sectional images show that Y1, PI and PB layers are single crystalline with the c-axis normal to the substrate surface. The Y2 layer in the regions of a multilayered structure is polycrystalline. The PB/Y1 interface is characterised by APB line boundaries; it is inclined to the substrate by 20-35deg. (orig.).