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Computer experiments on the imaging of point defects with the conventional transmission electron microscope

Conference:

Abstract

To aid in the interpretation of high resolution electron micrographs of defect structures in crystals, computer-simulated dark-field electron micrographs have been obtained for a variety of point defects in metals. Interpretation of these images in terms of atomic positions and atom correlations becomes straightforward, and it is a simple matter to distinguish between real structural information and image artifacts produced by the phase contrast mechanism in the electron optical imaging process.
Authors:
Krakow, W [1] 
  1. Xerox Corp., Rochester, N.Y. (USA)
Publication Date:
Feb 01, 1978
Product Type:
Conference
Report Number:
CONF-761027-
Reference Number:
AIX-09-396571; ERA-04-011743; EDB-79-016143
Resource Relation:
Journal Name: J. Nucl. Mater.; (Netherlands); Journal Volume: 69 and 70:1 and 2; Conference: International conference on properties on atomic defects on metals, Argonne, IL, USA, 18 Oct 1976
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; POINT DEFECTS; ELECTRON MICROSCOPY; IMAGES; SIMULATION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MICROSCOPY; 656000* - Condensed Matter Physics
OSTI ID:
6575712
Country of Origin:
Netherlands
Language:
English
Other Identifying Numbers:
Journal ID: CODEN: JNUMA
Submitting Site:
INIS
Size:
Pages: 656-659
Announcement Date:
May 13, 2001

Conference:

Citation Formats

Krakow, W. Computer experiments on the imaging of point defects with the conventional transmission electron microscope. Netherlands: N. p., 1978. Web.
Krakow, W. Computer experiments on the imaging of point defects with the conventional transmission electron microscope. Netherlands.
Krakow, W. 1978. "Computer experiments on the imaging of point defects with the conventional transmission electron microscope." Netherlands.
@misc{etde_6575712,
title = {Computer experiments on the imaging of point defects with the conventional transmission electron microscope}
author = {Krakow, W}
abstractNote = {To aid in the interpretation of high resolution electron micrographs of defect structures in crystals, computer-simulated dark-field electron micrographs have been obtained for a variety of point defects in metals. Interpretation of these images in terms of atomic positions and atom correlations becomes straightforward, and it is a simple matter to distinguish between real structural information and image artifacts produced by the phase contrast mechanism in the electron optical imaging process.}
journal = {J. Nucl. Mater.; (Netherlands)}
volume = {69 and 70:1 and 2}
place = {Netherlands}
year = {1978}
month = {Feb}
}