Abstract
To aid in the interpretation of high resolution electron micrographs of defect structures in crystals, computer-simulated dark-field electron micrographs have been obtained for a variety of point defects in metals. Interpretation of these images in terms of atomic positions and atom correlations becomes straightforward, and it is a simple matter to distinguish between real structural information and image artifacts produced by the phase contrast mechanism in the electron optical imaging process.
Krakow, W
[1]
- Xerox Corp., Rochester, N.Y. (USA)
Citation Formats
Krakow, W.
Computer experiments on the imaging of point defects with the conventional transmission electron microscope.
Netherlands: N. p.,
1978.
Web.
Krakow, W.
Computer experiments on the imaging of point defects with the conventional transmission electron microscope.
Netherlands.
Krakow, W.
1978.
"Computer experiments on the imaging of point defects with the conventional transmission electron microscope."
Netherlands.
@misc{etde_6575712,
title = {Computer experiments on the imaging of point defects with the conventional transmission electron microscope}
author = {Krakow, W}
abstractNote = {To aid in the interpretation of high resolution electron micrographs of defect structures in crystals, computer-simulated dark-field electron micrographs have been obtained for a variety of point defects in metals. Interpretation of these images in terms of atomic positions and atom correlations becomes straightforward, and it is a simple matter to distinguish between real structural information and image artifacts produced by the phase contrast mechanism in the electron optical imaging process.}
journal = {J. Nucl. Mater.; (Netherlands)}
volume = {69 and 70:1 and 2}
place = {Netherlands}
year = {1978}
month = {Feb}
}
title = {Computer experiments on the imaging of point defects with the conventional transmission electron microscope}
author = {Krakow, W}
abstractNote = {To aid in the interpretation of high resolution electron micrographs of defect structures in crystals, computer-simulated dark-field electron micrographs have been obtained for a variety of point defects in metals. Interpretation of these images in terms of atomic positions and atom correlations becomes straightforward, and it is a simple matter to distinguish between real structural information and image artifacts produced by the phase contrast mechanism in the electron optical imaging process.}
journal = {J. Nucl. Mater.; (Netherlands)}
volume = {69 and 70:1 and 2}
place = {Netherlands}
year = {1978}
month = {Feb}
}