The authors studied the purity, surface roughness and grain size of vacuum-deposited aluminium films, using an intermetallic crucible and a continuous feed of pure aluminium wire. The grain size and roughness were studied by electron difraction, X-ray diffraction and the scanning electron microscope. Purity was determined by X-ray fluorescence produced by proton bombardment in the Van de Graaff accelerator and by X-ray and optical emission spectrometry.
Dhere, N G; Arsenio, T P;  Patnaik, B K;  Assuncao, F C.R.; de Souza, A M 
- Instituto Militar de Engenharia, Rio de Janeiro (Brazil)
- Pontificia Universidade Catolica do Rio de Janeiro (Brazil). Instituto de Fisica
- Pontificia Universidade Catolica do Rio de Janeiro (Brazil). Departamento de Ciencia dos Materiais e Metalurgia