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Purity and surface roughness of vacuum deposited aluminium films

Conference:

Abstract

The authors studied the purity, surface roughness and grain size of vacuum-deposited aluminium films, using an intermetallic crucible and a continuous feed of pure aluminium wire. The grain size and roughness were studied by electron difraction, X-ray diffraction and the scanning electron microscope. Purity was determined by X-ray fluorescence produced by proton bombardment in the Van de Graaff accelerator and by X-ray and optical emission spectrometry.
Authors:
Dhere, N G; Arsenio, T P; [1]  Patnaik, B K; [2]  Assuncao, F C.R.; de Souza, A M [3] 
  1. Instituto Militar de Engenharia, Rio de Janeiro (Brazil)
  2. Pontificia Universidade Catolica do Rio de Janeiro (Brazil). Instituto de Fisica
  3. Pontificia Universidade Catolica do Rio de Janeiro (Brazil). Departamento de Ciencia dos Materiais e Metalurgia
Publication Date:
Apr 01, 1975
Product Type:
Conference
Reference Number:
AIX-10-429871; EDB-79-094871
Resource Relation:
Journal Name: Metalurgia (Sao Paulo); (Brazil); Journal Volume: 31:209; Conference: 29. Annual Congress of Brazilian Association of Metals, Porto Alegre, Brazil, 7 - 13 Jul 1974
Subject:
36 MATERIALS SCIENCE; ALUMINIUM; ROUGHNESS; SURFACE PROPERTIES; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FILMS; GRAIN SIZE; MICROSTRUCTURE; PROTON BEAMS; X-RAY DIFFRACTION; X-RAY EMISSION ANALYSIS; BEAMS; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; SCATTERING; SIZE; 360104* - Metals & Alloys- Physical Properties
OSTI ID:
6261904
Country of Origin:
Brazil
Language:
Portuguese
Other Identifying Numbers:
Journal ID: CODEN: MABMA
Submitting Site:
INIS
Size:
Pages: 227-233
Announcement Date:

Conference:

Citation Formats

Dhere, N G, Arsenio, T P, Patnaik, B K, Assuncao, F C.R., and de Souza, A M. Purity and surface roughness of vacuum deposited aluminium films. Brazil: N. p., 1975. Web.
Dhere, N G, Arsenio, T P, Patnaik, B K, Assuncao, F C.R., & de Souza, A M. Purity and surface roughness of vacuum deposited aluminium films. Brazil.
Dhere, N G, Arsenio, T P, Patnaik, B K, Assuncao, F C.R., and de Souza, A M. 1975. "Purity and surface roughness of vacuum deposited aluminium films." Brazil.
@misc{etde_6261904,
title = {Purity and surface roughness of vacuum deposited aluminium films}
author = {Dhere, N G, Arsenio, T P, Patnaik, B K, Assuncao, F C.R., and de Souza, A M}
abstractNote = {The authors studied the purity, surface roughness and grain size of vacuum-deposited aluminium films, using an intermetallic crucible and a continuous feed of pure aluminium wire. The grain size and roughness were studied by electron difraction, X-ray diffraction and the scanning electron microscope. Purity was determined by X-ray fluorescence produced by proton bombardment in the Van de Graaff accelerator and by X-ray and optical emission spectrometry.}
journal = {Metalurgia (Sao Paulo); (Brazil)}
volume = {31:209}
place = {Brazil}
year = {1975}
month = {Apr}
}