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Sample analysis using gamma ray induced fluorescent X-ray emission

Abstract

A non-destructive method for the analysis of materials using gamma ray-induced fluorescent x-ray emission has been developed. In this method, special preparation of very thin samples in which the absorption of the incident gamma rays and the emitted fluorescent x-rays is negligible, is not needed, and the absorption correction is determined experimentally. A suitable choice of the incident gamma ray energies is made to minimise enhancement effects through selective photoionization of the elements in the sample. The method is applied to the analysis of a typical sample of the soldering material using 279 keV and 59.5 keV gamma rays from /sup 203/Hg and /sup 241/Am radioactive sources respectively. The results of the analysis are found to agree well with those obtained from the chemical analysis.
Authors:
Sood, B S; Allawadhi, K L; Gandhi, R; Batra, O P; Singh, N [1] 
  1. Punjabi Univ., Patiala (India). Nuclear Science Labs.
Publication Date:
Jan 01, 1983
Product Type:
Journal Article
Reference Number:
AIX-14-753757; EDB-83-112469
Resource Relation:
Journal Name: X-Ray Spectrom.; (United Kingdom); Journal Volume: 12:1
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ANTIMONY; X-RAY FLUORESCENCE ANALYSIS; LEAD; TIN; ABSORPTION; ACCURACY; AMERICIUM 241; CHEMICAL PREPARATION; ENERGY; GAMMA RADIATION; GAMMA SOURCES; MERCURY 203; NONDESTRUCTIVE ANALYSIS; PHOTOIONIZATION; QUANTITATIVE CHEMICAL ANALYSIS; SOLDERING; ACTINIDE ISOTOPES; ACTINIDE NUCLEI; ALPHA DECAY RADIOISOTOPES; AMERICIUM ISOTOPES; BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; CHEMICAL ANALYSIS; DAYS LIVING RADIOISOTOPES; ELECTROMAGNETIC RADIATION; ELEMENTS; EVEN-ODD NUCLEI; FABRICATION; HEAVY NUCLEI; IONIZATION; IONIZING RADIATIONS; ISOTOPES; JOINING; MERCURY ISOTOPES; METALS; NUCLEI; ODD-EVEN NUCLEI; RADIATION SOURCES; RADIATIONS; RADIOISOTOPES; SYNTHESIS; WELDING; X-RAY EMISSION ANALYSIS; YEARS LIVING RADIOISOTOPES; 400103* - Radiometric & Radiochemical Procedures- (-1987)
OSTI ID:
6236213
Country of Origin:
United Kingdom
Language:
English
Other Identifying Numbers:
Journal ID: CODEN: XRSPA
Submitting Site:
HEDB
Size:
Pages: 19-22
Announcement Date:

Citation Formats

Sood, B S, Allawadhi, K L, Gandhi, R, Batra, O P, and Singh, N. Sample analysis using gamma ray induced fluorescent X-ray emission. United Kingdom: N. p., 1983. Web. doi:10.1002/xrs.1300120106.
Sood, B S, Allawadhi, K L, Gandhi, R, Batra, O P, & Singh, N. Sample analysis using gamma ray induced fluorescent X-ray emission. United Kingdom. doi:10.1002/xrs.1300120106.
Sood, B S, Allawadhi, K L, Gandhi, R, Batra, O P, and Singh, N. 1983. "Sample analysis using gamma ray induced fluorescent X-ray emission." United Kingdom. doi:10.1002/xrs.1300120106. https://www.osti.gov/servlets/purl/10.1002/xrs.1300120106.
@misc{etde_6236213,
title = {Sample analysis using gamma ray induced fluorescent X-ray emission}
author = {Sood, B S, Allawadhi, K L, Gandhi, R, Batra, O P, and Singh, N}
abstractNote = {A non-destructive method for the analysis of materials using gamma ray-induced fluorescent x-ray emission has been developed. In this method, special preparation of very thin samples in which the absorption of the incident gamma rays and the emitted fluorescent x-rays is negligible, is not needed, and the absorption correction is determined experimentally. A suitable choice of the incident gamma ray energies is made to minimise enhancement effects through selective photoionization of the elements in the sample. The method is applied to the analysis of a typical sample of the soldering material using 279 keV and 59.5 keV gamma rays from /sup 203/Hg and /sup 241/Am radioactive sources respectively. The results of the analysis are found to agree well with those obtained from the chemical analysis.}
doi = {10.1002/xrs.1300120106}
journal = {X-Ray Spectrom.; (United Kingdom)}
volume = {12:1}
journal type = {AC}
place = {United Kingdom}
year = {1983}
month = {Jan}
}