Abstract
The dependence of H concentration on the layer thickness in H charged Nb/Cu multilayer samples has been studied using {sup 15}N resonance nuclear reaction analysis({sup 15}N-NRA) and high energy elastic recoil detection analysis(HE-ERDA). Also a simulation code has been developed for accurate simulation of the {sup 1}H({sup 15}N,{alpha}{gamma}){sup 12}C4.43 MeV {gamma}-yields at 6.385 MeV and 13.365 MeV reaction energy. The simulation are in good agreement with the experimental results. The present results show smooth increase of the H concentrations in Nb layers with increasing layer thickness. (author)
Yamamoto, Shunya;
Goppelt-Langer, P;
Naramoto, Hiroshi;
Aoki, Yasushi;
Takeshita, Hidefumi
[1]
- Japan Atomic Energy Research Inst., Takasaki, Gunma (Japan). Takasaki Radiation Chemistry Research Establishment
Citation Formats
Yamamoto, Shunya, Goppelt-Langer, P, Naramoto, Hiroshi, Aoki, Yasushi, and Takeshita, Hidefumi.
Ion beam analysis of multi-layered structure in Nb/Cu system.
Japan: N. p.,
1997.
Web.
Yamamoto, Shunya, Goppelt-Langer, P, Naramoto, Hiroshi, Aoki, Yasushi, & Takeshita, Hidefumi.
Ion beam analysis of multi-layered structure in Nb/Cu system.
Japan.
Yamamoto, Shunya, Goppelt-Langer, P, Naramoto, Hiroshi, Aoki, Yasushi, and Takeshita, Hidefumi.
1997.
"Ion beam analysis of multi-layered structure in Nb/Cu system."
Japan.
@misc{etde_588408,
title = {Ion beam analysis of multi-layered structure in Nb/Cu system}
author = {Yamamoto, Shunya, Goppelt-Langer, P, Naramoto, Hiroshi, Aoki, Yasushi, and Takeshita, Hidefumi}
abstractNote = {The dependence of H concentration on the layer thickness in H charged Nb/Cu multilayer samples has been studied using {sup 15}N resonance nuclear reaction analysis({sup 15}N-NRA) and high energy elastic recoil detection analysis(HE-ERDA). Also a simulation code has been developed for accurate simulation of the {sup 1}H({sup 15}N,{alpha}{gamma}){sup 12}C4.43 MeV {gamma}-yields at 6.385 MeV and 13.365 MeV reaction energy. The simulation are in good agreement with the experimental results. The present results show smooth increase of the H concentrations in Nb layers with increasing layer thickness. (author)}
place = {Japan}
year = {1997}
month = {Mar}
}
title = {Ion beam analysis of multi-layered structure in Nb/Cu system}
author = {Yamamoto, Shunya, Goppelt-Langer, P, Naramoto, Hiroshi, Aoki, Yasushi, and Takeshita, Hidefumi}
abstractNote = {The dependence of H concentration on the layer thickness in H charged Nb/Cu multilayer samples has been studied using {sup 15}N resonance nuclear reaction analysis({sup 15}N-NRA) and high energy elastic recoil detection analysis(HE-ERDA). Also a simulation code has been developed for accurate simulation of the {sup 1}H({sup 15}N,{alpha}{gamma}){sup 12}C4.43 MeV {gamma}-yields at 6.385 MeV and 13.365 MeV reaction energy. The simulation are in good agreement with the experimental results. The present results show smooth increase of the H concentrations in Nb layers with increasing layer thickness. (author)}
place = {Japan}
year = {1997}
month = {Mar}
}