Abstract
Energetic heavy-ion irradiation apparatus has been developed for single-event effects (SEE) testing. We have applied three irradiation methods such as a scattered-ion irradiation method, a recoiled-atom irradiation method, and a direct-beam irradiation method to perform SEE testing efficiently. (author)
Nashiyama, Isamu;
Hirao, Toshio;
Itoh, Hisayoshi;
Ohshima, Takeshi
[1]
- Japan Atomic Energy Research Inst., Takasaki, Gunma (Japan). Takasaki Radiation Chemistry Research Establishment
Citation Formats
Nashiyama, Isamu, Hirao, Toshio, Itoh, Hisayoshi, and Ohshima, Takeshi.
Effects of ion beam irradiation on semiconductor devices.
Japan: N. p.,
1997.
Web.
Nashiyama, Isamu, Hirao, Toshio, Itoh, Hisayoshi, & Ohshima, Takeshi.
Effects of ion beam irradiation on semiconductor devices.
Japan.
Nashiyama, Isamu, Hirao, Toshio, Itoh, Hisayoshi, and Ohshima, Takeshi.
1997.
"Effects of ion beam irradiation on semiconductor devices."
Japan.
@misc{etde_588277,
title = {Effects of ion beam irradiation on semiconductor devices}
author = {Nashiyama, Isamu, Hirao, Toshio, Itoh, Hisayoshi, and Ohshima, Takeshi}
abstractNote = {Energetic heavy-ion irradiation apparatus has been developed for single-event effects (SEE) testing. We have applied three irradiation methods such as a scattered-ion irradiation method, a recoiled-atom irradiation method, and a direct-beam irradiation method to perform SEE testing efficiently. (author)}
place = {Japan}
year = {1997}
month = {Mar}
}
title = {Effects of ion beam irradiation on semiconductor devices}
author = {Nashiyama, Isamu, Hirao, Toshio, Itoh, Hisayoshi, and Ohshima, Takeshi}
abstractNote = {Energetic heavy-ion irradiation apparatus has been developed for single-event effects (SEE) testing. We have applied three irradiation methods such as a scattered-ion irradiation method, a recoiled-atom irradiation method, and a direct-beam irradiation method to perform SEE testing efficiently. (author)}
place = {Japan}
year = {1997}
month = {Mar}
}