Abstract
Identification of relativistic charged particles by means of fine sampling d E/d X measurements with a longitudinal drift chamber has been studied. Using a fast-sampling ADC (25 MHz), dE/dX was measured in a 1.4 mm gas thickness over an electron drift space of 51 mm. For the simulated 1 m long tracks of pions and electrons of 500 MeV/c, a particle separation of 10sigma - 12sigma has been obtained, where sigma is the r.m.s. resolution of the dE/dX measurement. This result with fine sampling is better by a factor of 1.7 compared to the dE/dX measurement, with 21 mm sampling thickness. Further improvement achievable by reducing the correlation between neighbouring samples and simplification of electronics by use of the delta-ray clipping method are also discussed.
Imanishi, A;
Ishii, T;
Ohshima, T;
Okuno, H;
Shiino, K;
[1]
Naito, F;
[2]
Matsuda, T
[3]
- Tokyo Univ., Tanashi (Japan). Inst. for Nuclear Study
- Tokyo Univ. of Agriculture and Technology, Koganei (Japan). Faculty of Technology
- Osaka Univ., Toyonaka (Japan). Faculty of Engineering Science
Citation Formats
Imanishi, A, Ishii, T, Ohshima, T, Okuno, H, Shiino, K, Naito, F, and Matsuda, T.
Particle identification by means of fine sampling dE/dX measurements.
Netherlands: N. p.,
1983.
Web.
doi:10.1016/0167-5087(83)90646-4.
Imanishi, A, Ishii, T, Ohshima, T, Okuno, H, Shiino, K, Naito, F, & Matsuda, T.
Particle identification by means of fine sampling dE/dX measurements.
Netherlands.
https://doi.org/10.1016/0167-5087(83)90646-4
Imanishi, A, Ishii, T, Ohshima, T, Okuno, H, Shiino, K, Naito, F, and Matsuda, T.
1983.
"Particle identification by means of fine sampling dE/dX measurements."
Netherlands.
https://doi.org/10.1016/0167-5087(83)90646-4.
@misc{etde_5704589,
title = {Particle identification by means of fine sampling dE/dX measurements}
author = {Imanishi, A, Ishii, T, Ohshima, T, Okuno, H, Shiino, K, Naito, F, and Matsuda, T}
abstractNote = {Identification of relativistic charged particles by means of fine sampling d E/d X measurements with a longitudinal drift chamber has been studied. Using a fast-sampling ADC (25 MHz), dE/dX was measured in a 1.4 mm gas thickness over an electron drift space of 51 mm. For the simulated 1 m long tracks of pions and electrons of 500 MeV/c, a particle separation of 10sigma - 12sigma has been obtained, where sigma is the r.m.s. resolution of the dE/dX measurement. This result with fine sampling is better by a factor of 1.7 compared to the dE/dX measurement, with 21 mm sampling thickness. Further improvement achievable by reducing the correlation between neighbouring samples and simplification of electronics by use of the delta-ray clipping method are also discussed.}
doi = {10.1016/0167-5087(83)90646-4}
journal = []
volume = {207:3}
journal type = {AC}
place = {Netherlands}
year = {1983}
month = {Apr}
}
title = {Particle identification by means of fine sampling dE/dX measurements}
author = {Imanishi, A, Ishii, T, Ohshima, T, Okuno, H, Shiino, K, Naito, F, and Matsuda, T}
abstractNote = {Identification of relativistic charged particles by means of fine sampling d E/d X measurements with a longitudinal drift chamber has been studied. Using a fast-sampling ADC (25 MHz), dE/dX was measured in a 1.4 mm gas thickness over an electron drift space of 51 mm. For the simulated 1 m long tracks of pions and electrons of 500 MeV/c, a particle separation of 10sigma - 12sigma has been obtained, where sigma is the r.m.s. resolution of the dE/dX measurement. This result with fine sampling is better by a factor of 1.7 compared to the dE/dX measurement, with 21 mm sampling thickness. Further improvement achievable by reducing the correlation between neighbouring samples and simplification of electronics by use of the delta-ray clipping method are also discussed.}
doi = {10.1016/0167-5087(83)90646-4}
journal = []
volume = {207:3}
journal type = {AC}
place = {Netherlands}
year = {1983}
month = {Apr}
}