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On response operator in semiconductor gamma ray spectrometry

Abstract

Some results of the scaling confirmation factor analysis (SCFA) application in semiconductor gamma-ray spectrometry presented in this contribution points out to a new ground for evaluation the gamma-ray spectra. This whole-spectrum processing approach considerably increases detection sensitivity, especially, if significant interferences being present in the measured spectrum. Precision of the SCFA method is determined by choice of a sufficient number of suitable calibration gamma-ray sources in the energy region of interest, by setting up an acceptable latent hypothesis and by chosen experimental quantification of spectra. The SCFA method is very advantageous to use, for instance, in ultra low-level gamma-spectrometry where counting rates in full energy peaks are extremely low as compared with background interferences. It enables to increase of the sensitivity by the 5-10 times in comparison with the traditional full energy peak net area method (J.K.). 1 fig., 2 tabs., 6 refs.
Authors:
Krnac, S; [1]  Povinec, P; [2]  Ragan, R [3] 
  1. Slovak Technical Univ., Bratislava (Slovakia)
  2. International Atomic Energy Agency, Monaco (Monaco). MEL
  3. Inst. of Preventive and Clinical Medicine, Bratislava (Slovakia)
Publication Date:
Dec 31, 1995
Product Type:
Miscellaneous
Report Number:
INIS-SK-97-001; CONF-9511264-
Reference Number:
SCA: 440103; PA: AIX-28:076387; EDB-98:003083; SN: 97001880726
Resource Relation:
Conference: 19. radiation hygiene days (RHD) Jasna, Jasna Pod Chopkom (Slovakia), 20-23 Nov 1995; Other Information: PBD: 1995; Related Information: Is Part Of 19th Radiation Hygiene Days. Conference Proceedings; PB: 208 p.
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; MEASURING INSTRUMENTS; COMPARATIVE EVALUATIONS; GAMMA SPECTROMETERS; AMERICIUM 241; CESIUM 137; COBALT 57; COBALT 60; EUROPIUM 152; EXPERIMENTAL DATA; GAMMA DETECTION; GAMMA SOURCES; GAMMA SPECTROSCOPY; SODIUM 22; YTTRIUM 88
OSTI ID:
550251
Research Organizations:
Slovak Medical Association, Bratislava (Slovakia). Society of Nuclear Medicine and Radiation Hygiene; Institute of Preventive and Clinical Medicine, Bratislava (Slovakia); State Specialized Health Inst., Banska Bystrica (Slovakia)
Country of Origin:
Slovakia
Language:
English
Other Identifying Numbers:
Other: ON: DE98604320; TRN: SK97K0210076387
Availability:
INIS; OSTI as DE98604320
Submitting Site:
INIS
Size:
pp. 89-93
Announcement Date:

Citation Formats

Krnac, S, Povinec, P, and Ragan, R. On response operator in semiconductor gamma ray spectrometry. Slovakia: N. p., 1995. Web.
Krnac, S, Povinec, P, & Ragan, R. On response operator in semiconductor gamma ray spectrometry. Slovakia.
Krnac, S, Povinec, P, and Ragan, R. 1995. "On response operator in semiconductor gamma ray spectrometry." Slovakia.
@misc{etde_550251,
title = {On response operator in semiconductor gamma ray spectrometry}
author = {Krnac, S, Povinec, P, and Ragan, R}
abstractNote = {Some results of the scaling confirmation factor analysis (SCFA) application in semiconductor gamma-ray spectrometry presented in this contribution points out to a new ground for evaluation the gamma-ray spectra. This whole-spectrum processing approach considerably increases detection sensitivity, especially, if significant interferences being present in the measured spectrum. Precision of the SCFA method is determined by choice of a sufficient number of suitable calibration gamma-ray sources in the energy region of interest, by setting up an acceptable latent hypothesis and by chosen experimental quantification of spectra. The SCFA method is very advantageous to use, for instance, in ultra low-level gamma-spectrometry where counting rates in full energy peaks are extremely low as compared with background interferences. It enables to increase of the sensitivity by the 5-10 times in comparison with the traditional full energy peak net area method (J.K.). 1 fig., 2 tabs., 6 refs.}
place = {Slovakia}
year = {1995}
month = {Dec}
}