You need JavaScript to view this

Generation of single failures in memory devices irradiated by 1 GeV protons; Generatsiya edinichnykh sboev v ustrojstvakh pamyati, obluchaemykh protonami s ehnergiej 1 GehV

Abstract

Cross sections of single reversible failures in the logic state of memory cells irradiated with 1 GeV energy protons are measured. It is found that the failure cross section does not depend on the beam intensity on the absorbed dose and on the source logic state of the memory cells.
Authors:
Ageev, S V [1] 
  1. and others
Publication Date:
Dec 31, 1993
Product Type:
Miscellaneous
Report Number:
INIS-RU-430
Reference Number:
SCA: 440200; PA: AIX-28:076652; EDB-97:146128; SN: 97001880907
Resource Relation:
Other Information: PBD: 1993; Related Information: Is Part Of Problems of nuclear science and technology. Scientific-technical collection; Chernov, V.M. [ed.]; PB: 139 p.; Voprosy atomnoj nauki i tekhniki. Nauchno-tekhnicheskij sbornik; Fizika radiatsionnogo vozdejstviya na radioehlektronnuyu apparaturu
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; SEMICONDUCTOR STORAGE DEVICES; PHYSICAL RADIATION EFFECTS; SYSTEM FAILURE ANALYSIS; MICROELECTRONIC CIRCUITS
OSTI ID:
546429
Research Organizations:
Ministerstvo Atomnoj Ehnergetiki Rossijskoj Federatsii, Moscow (Russian Federation); Tsentral`nyj Nauchno-Issledovatel`skij Inst. Upravleniya, Ehkonomiki i Informatsii, Moscow (Russian Federation)
Country of Origin:
Russian Federation
Language:
Russian
Other Identifying Numbers:
Other: ON: DE98603670; TRN: RU9710206076652
Availability:
INIS; OSTI as DE98603670
Submitting Site:
INIS
Size:
pp. 95-99
Announcement Date:
Dec 10, 1997

Citation Formats

Ageev, S V. Generation of single failures in memory devices irradiated by 1 GeV protons; Generatsiya edinichnykh sboev v ustrojstvakh pamyati, obluchaemykh protonami s ehnergiej 1 GehV. Russian Federation: N. p., 1993. Web.
Ageev, S V. Generation of single failures in memory devices irradiated by 1 GeV protons; Generatsiya edinichnykh sboev v ustrojstvakh pamyati, obluchaemykh protonami s ehnergiej 1 GehV. Russian Federation.
Ageev, S V. 1993. "Generation of single failures in memory devices irradiated by 1 GeV protons; Generatsiya edinichnykh sboev v ustrojstvakh pamyati, obluchaemykh protonami s ehnergiej 1 GehV." Russian Federation.
@misc{etde_546429,
title = {Generation of single failures in memory devices irradiated by 1 GeV protons; Generatsiya edinichnykh sboev v ustrojstvakh pamyati, obluchaemykh protonami s ehnergiej 1 GehV}
author = {Ageev, S V}
abstractNote = {Cross sections of single reversible failures in the logic state of memory cells irradiated with 1 GeV energy protons are measured. It is found that the failure cross section does not depend on the beam intensity on the absorbed dose and on the source logic state of the memory cells.}
place = {Russian Federation}
year = {1993}
month = {Dec}
}