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Electron microscopy in solid state physics

Abstract

This book reports on the capabilities and limitations of the application of electron microscopy to solid state physics and materials science. It is divided into two parts: 'Electron Microscopic Methods' and 'Applications in Solid State Physics'. In the first part the methods of electron microscope examination employed in solid state physics are described, with special reference to the reliable interpretation of electron micrographs (image formation, image interpretation). Without any claim to completeness, the second part of the book on the applications of electron microscopy comprises those fields of solid state physics and materials science to which it may appreciably contribute.
Authors:
Bethge, H; Heydenreich, J [1] 
  1. eds.
Publication Date:
Jan 01, 1987
Product Type:
Book
Reference Number:
AIX-19-024726; EDB-88-070207
Resource Relation:
Other Information: Revised translation of 'Elektronenmikroskopie in der Festkoerperphysik'; includes subject index; Related Information: Materials Science Monographs. v. 40
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; SCANNING ELECTRON MICROSCOPY; SOLID STATE PHYSICS; CRYSTAL DEFECTS; ELECTRON DIFFRACTION; FRACTOGRAPHY; FRACTURES; IMAGE PROCESSING; IMAGES; SURFACES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; FAILURES; MICROSCOPY; PHYSICS; PROCESSING; SCATTERING; 656003* - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)
OSTI ID:
5334977
Country of Origin:
Netherlands
Language:
English
Submitting Site:
INIS
Size:
Pages: 596
Announcement Date:
May 13, 2001

Citation Formats

Bethge, H, and Heydenreich, J. Electron microscopy in solid state physics. Netherlands: N. p., 1987. Web.
Bethge, H, & Heydenreich, J. Electron microscopy in solid state physics. Netherlands.
Bethge, H, and Heydenreich, J. 1987. "Electron microscopy in solid state physics." Netherlands.
@misc{etde_5334977,
title = {Electron microscopy in solid state physics}
author = {Bethge, H, and Heydenreich, J}
abstractNote = {This book reports on the capabilities and limitations of the application of electron microscopy to solid state physics and materials science. It is divided into two parts: 'Electron Microscopic Methods' and 'Applications in Solid State Physics'. In the first part the methods of electron microscope examination employed in solid state physics are described, with special reference to the reliable interpretation of electron micrographs (image formation, image interpretation). Without any claim to completeness, the second part of the book on the applications of electron microscopy comprises those fields of solid state physics and materials science to which it may appreciably contribute.}
place = {Netherlands}
year = {1987}
month = {Jan}
}