Abstract
It is known that diamond is amorphized or graphitized when irradiated above a critical dose. Above this critical dose, D{sub c}, the resistance R is found to drop very rapidly due to the formation of graphite regions which overlap at D{sub c} to form a semi-continuous electrically conducting pathway through the sample. One particularly interesting method of studying this transformation is electron energy-loss spectroscopy (EELS). Using EELS, the different phases of carbon can be identified and distinguished from each other using the extended energy-loss fine structure (EXELFS) of the core-loss part of the spectrum. EELS is a sensitive method for determining the electronic structure of small areas of a sample. In this paper, transmission electron microscopy (TEM) and EELS measurements of the ion irradiated diamond were combined in an attempt to correlate the microstructural nature of the ion-beam induced damage to the changes in the electrical and other properties. 7 refs., 1 tab., 2 figs.
Lai, P F;
Prawer, S;
Spargo, A E.C.;
Bursill, L A
[1]
- Melbourne Univ., Parkville, VIC (Australia). School of Physics
Citation Formats
Lai, P F, Prawer, S, Spargo, A E.C., and Bursill, L A.
Studies of defects on ion irradiated diamond.
Australia: N. p.,
1996.
Web.
Lai, P F, Prawer, S, Spargo, A E.C., & Bursill, L A.
Studies of defects on ion irradiated diamond.
Australia.
Lai, P F, Prawer, S, Spargo, A E.C., and Bursill, L A.
1996.
"Studies of defects on ion irradiated diamond."
Australia.
@misc{etde_520695,
title = {Studies of defects on ion irradiated diamond}
author = {Lai, P F, Prawer, S, Spargo, A E.C., and Bursill, L A}
abstractNote = {It is known that diamond is amorphized or graphitized when irradiated above a critical dose. Above this critical dose, D{sub c}, the resistance R is found to drop very rapidly due to the formation of graphite regions which overlap at D{sub c} to form a semi-continuous electrically conducting pathway through the sample. One particularly interesting method of studying this transformation is electron energy-loss spectroscopy (EELS). Using EELS, the different phases of carbon can be identified and distinguished from each other using the extended energy-loss fine structure (EXELFS) of the core-loss part of the spectrum. EELS is a sensitive method for determining the electronic structure of small areas of a sample. In this paper, transmission electron microscopy (TEM) and EELS measurements of the ion irradiated diamond were combined in an attempt to correlate the microstructural nature of the ion-beam induced damage to the changes in the electrical and other properties. 7 refs., 1 tab., 2 figs.}
place = {Australia}
year = {1996}
month = {Dec}
}
title = {Studies of defects on ion irradiated diamond}
author = {Lai, P F, Prawer, S, Spargo, A E.C., and Bursill, L A}
abstractNote = {It is known that diamond is amorphized or graphitized when irradiated above a critical dose. Above this critical dose, D{sub c}, the resistance R is found to drop very rapidly due to the formation of graphite regions which overlap at D{sub c} to form a semi-continuous electrically conducting pathway through the sample. One particularly interesting method of studying this transformation is electron energy-loss spectroscopy (EELS). Using EELS, the different phases of carbon can be identified and distinguished from each other using the extended energy-loss fine structure (EXELFS) of the core-loss part of the spectrum. EELS is a sensitive method for determining the electronic structure of small areas of a sample. In this paper, transmission electron microscopy (TEM) and EELS measurements of the ion irradiated diamond were combined in an attempt to correlate the microstructural nature of the ion-beam induced damage to the changes in the electrical and other properties. 7 refs., 1 tab., 2 figs.}
place = {Australia}
year = {1996}
month = {Dec}
}