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Device for high-temperature X-ray diffraction analysis. Ustrojstvo dlya vysokotemperaturnogo rentgenostrukturnogo analiza

Patent:

Abstract

Device for high-temperature X-ray diffraction analysis, containing a vacuum chamber with a window for X-ray transit, in which sample- and standard-holders, heater, thermal shields and means for standard and sample temperature measurement are located, is proposed. In order to increase the working temperature level and the structural change detection accuracy the heater is located between the sample- and standard-holders. The standard-holder is linked with the mechanism of control of its position in relation to the heater. The device is intended for investigating phase transformations by differential thermal analysis method with the simultaneous diffraction pattern detection using X-ray diffractometry method.
Publication Date:
Jan 07, 1975
Product Type:
Patent
Report Number:
SU 518066; A
Reference Number:
AIX-17-072987; EDB-86-177255
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 47 OTHER INSTRUMENTATION; DIFFERENTIAL THERMAL ANALYSIS; EQUIPMENT; X-RAY DIFFRACTION; PATTERN RECOGNITION; ACCURACY; HEATERS; HIGH VACUUM; LOW PRESSURE; OPTIMIZATION; PERFORMANCE; PHASE TRANSFORMATIONS; SAMPLE HOLDERS; SOLIDS; TEMPERATURE MEASUREMENT; THERMAL SHIELDS; VERY HIGH TEMPERATURE; COHERENT SCATTERING; DIFFRACTION; SCATTERING; SHIELDS; THERMAL ANALYSIS; 440105* - Radiation Instrumentation- Radiometric Instruments- (-1987); 440300 - Miscellaneous Instruments- (-1989)
OSTI ID:
5182618
Research Organizations:
AN Ukrainskoj SSR, Kiev. Inst. Metallofiziki
Country of Origin:
USSR
Language:
Russian
Submitting Site:
INIS
Size:
Pages: 2
Announcement Date:

Patent:

Citation Formats

Epifanov, V G, Zavilinskij, A V, Pet'kov, V V, and Polenur, A V. Device for high-temperature X-ray diffraction analysis. Ustrojstvo dlya vysokotemperaturnogo rentgenostrukturnogo analiza. USSR: N. p., 1975. Web.
Epifanov, V G, Zavilinskij, A V, Pet'kov, V V, & Polenur, A V. Device for high-temperature X-ray diffraction analysis. Ustrojstvo dlya vysokotemperaturnogo rentgenostrukturnogo analiza. USSR.
Epifanov, V G, Zavilinskij, A V, Pet'kov, V V, and Polenur, A V. 1975. "Device for high-temperature X-ray diffraction analysis. Ustrojstvo dlya vysokotemperaturnogo rentgenostrukturnogo analiza." USSR.
@misc{etde_5182618,
title = {Device for high-temperature X-ray diffraction analysis. Ustrojstvo dlya vysokotemperaturnogo rentgenostrukturnogo analiza}
author = {Epifanov, V G, Zavilinskij, A V, Pet'kov, V V, and Polenur, A V}
abstractNote = {Device for high-temperature X-ray diffraction analysis, containing a vacuum chamber with a window for X-ray transit, in which sample- and standard-holders, heater, thermal shields and means for standard and sample temperature measurement are located, is proposed. In order to increase the working temperature level and the structural change detection accuracy the heater is located between the sample- and standard-holders. The standard-holder is linked with the mechanism of control of its position in relation to the heater. The device is intended for investigating phase transformations by differential thermal analysis method with the simultaneous diffraction pattern detection using X-ray diffractometry method.}
place = {USSR}
year = {1975}
month = {Jan}
}