Abstract
Some of the principles which govern the analytic methods available for the detection and quantitative measurement of impurity concentrations in semiconductors are described. Ways of assuring the quality of analytical data are suggested. (SPH)
Citation Formats
Lindstrom, R M.
Measuring trace elements in semiconductors: methods and pitfalls.
Netherlands: N. p.,
1980.
Web.
Lindstrom, R M.
Measuring trace elements in semiconductors: methods and pitfalls.
Netherlands.
Lindstrom, R M.
1980.
"Measuring trace elements in semiconductors: methods and pitfalls."
Netherlands.
@misc{etde_5131308,
title = {Measuring trace elements in semiconductors: methods and pitfalls}
author = {Lindstrom, R M}
abstractNote = {Some of the principles which govern the analytic methods available for the detection and quantitative measurement of impurity concentrations in semiconductors are described. Ways of assuring the quality of analytical data are suggested. (SPH)}
journal = []
volume = {1:2}
journal type = {AC}
place = {Netherlands}
year = {1980}
month = {Feb}
}
title = {Measuring trace elements in semiconductors: methods and pitfalls}
author = {Lindstrom, R M}
abstractNote = {Some of the principles which govern the analytic methods available for the detection and quantitative measurement of impurity concentrations in semiconductors are described. Ways of assuring the quality of analytical data are suggested. (SPH)}
journal = []
volume = {1:2}
journal type = {AC}
place = {Netherlands}
year = {1980}
month = {Feb}
}