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The nuclear interaction analysis methods for diagnostics of high power ion beam technologies

Abstract

The complex of Nuclear Interaction Analysis Methods including charged particle activation analysis (CPAA and HIAA), spectrometry of ion induced gamma-emission (PIGE and HIIGE) , characteristic X-ray emission (PIXE), and Rutherford Backscattering Spectrometry (RBS), have been used for diagnostics of the High Power Ion Beam (HPIB) assisted technologies. Accelerated ion beams from the EG-2.5 electrostatic generator and U-120 cyclotron were used for implementation of the techniques. The complex allows a lot of problems of elemental and isotopic analysis to be addressed. First, it is the determination of micro- and macrocomponents of modified materials; second, determination of surface density of thin films, multilayers and coatings, total surface gaseous contamination and amounts of the elements implanted in specimens; third, measurement of concentration depth profiles of the elements. Experiments have shown that the preferable application of nuclear analysis methods allows us to avoid the considerable errors arising when the concentration depth profiles of elements are measured by SIMS or AES in studies of mass transfer processes induced by HPIBs. (author). 1 tab., 2 figs., 3 refs.
Authors:
Ryzhkov, V A; Grushin, I I; Remnev, G E [1] 
  1. Nuclear Physics Inst., Tomsk (Russian Federation)
Publication Date:
Dec 31, 1996
Product Type:
Conference
Report Number:
INIS-CZ-0003; CONF-960610-
Reference Number:
SCA: 400101; 070204; PA: AIX-28:054410; EDB-97:112438; SN: 97001833875
Resource Relation:
Conference: BEAMS `96: 11. international conference on high-power particle beams, Prague (Czech Republic), 10-14 Jun 1996; Other Information: PBD: 1996; Related Information: Is Part Of Beams `96. Proceedings of the 11th international conference on high power particle beams. Vol. II; Jungwirth, K.; Ullschmied, J. [eds.]; PB: [692] p.
Subject:
40 CHEMISTRY; 07 ISOTOPE AND RADIATION SOURCE TECHNOLOGY; CHARGED-PARTICLE ACTIVATION ANALYSIS; SENSITIVITY; ION BEAMS; NUCLEAR REACTIONS; BACKSCATTERING; CONCENTRATION RATIO; GAMMA SPECTROSCOPY; ION IMPLANTATION; PENETRATION DEPTH; RUTHERFORD SCATTERING; X-RAY EMISSION ANALYSIS
OSTI ID:
510673
Research Organizations:
Ceskoslovenska Akademie Ved, Prague (Czech Republic). Ustav Fyziky Plazmatu
Country of Origin:
Czech Republic
Language:
English
Other Identifying Numbers:
Other: ON: DE97637209; ISBN 80-902250-4-7; TRN: CZ9726867054410
Availability:
INIS; OSTI as DE97637209
Submitting Site:
INIS
Size:
pp. 869-872
Announcement Date:
Sep 04, 1997

Citation Formats

Ryzhkov, V A, Grushin, I I, and Remnev, G E. The nuclear interaction analysis methods for diagnostics of high power ion beam technologies. Czech Republic: N. p., 1996. Web.
Ryzhkov, V A, Grushin, I I, & Remnev, G E. The nuclear interaction analysis methods for diagnostics of high power ion beam technologies. Czech Republic.
Ryzhkov, V A, Grushin, I I, and Remnev, G E. 1996. "The nuclear interaction analysis methods for diagnostics of high power ion beam technologies." Czech Republic.
@misc{etde_510673,
title = {The nuclear interaction analysis methods for diagnostics of high power ion beam technologies}
author = {Ryzhkov, V A, Grushin, I I, and Remnev, G E}
abstractNote = {The complex of Nuclear Interaction Analysis Methods including charged particle activation analysis (CPAA and HIAA), spectrometry of ion induced gamma-emission (PIGE and HIIGE) , characteristic X-ray emission (PIXE), and Rutherford Backscattering Spectrometry (RBS), have been used for diagnostics of the High Power Ion Beam (HPIB) assisted technologies. Accelerated ion beams from the EG-2.5 electrostatic generator and U-120 cyclotron were used for implementation of the techniques. The complex allows a lot of problems of elemental and isotopic analysis to be addressed. First, it is the determination of micro- and macrocomponents of modified materials; second, determination of surface density of thin films, multilayers and coatings, total surface gaseous contamination and amounts of the elements implanted in specimens; third, measurement of concentration depth profiles of the elements. Experiments have shown that the preferable application of nuclear analysis methods allows us to avoid the considerable errors arising when the concentration depth profiles of elements are measured by SIMS or AES in studies of mass transfer processes induced by HPIBs. (author). 1 tab., 2 figs., 3 refs.}
place = {Czech Republic}
year = {1996}
month = {Dec}
}