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Intermittent contact atomic force microscopy in electrochemical environment

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Abstract

In situ measurements with Atomic Force Microscopy may cause surface modifications due to the tip-surface interactions. As an alternative and less destructive method, Intermittent Contact Atomic Force Microscopy (ICAFM) has been tested in an electrolytic environment. In the ICAFM mode the tip is not constantly in contact with the surface under investigation but is tapping onto the surface with a certain frequency. A commercial Park Scientific Instruments Microscopy has been modified to enable in situ experiment with ICAFM. It was possible to image iridium oxide films with ICAFM in the electrolytic environment without any noticeable surface modifications. (author) 3 figs., 4 refs.
Authors:
Haering, P; Koetz, R; [1]  Siegenthaler, H [2] 
  1. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  2. Bern Univ., Bern (Switzerland)
Publication Date:
Jun 01, 1997
Product Type:
Miscellaneous
Report Number:
ETDE/CH-mf-97750556
Reference Number:
SCA: 400400; PA: CH-97:0E0201; EDB-97:092679; SN: 97001800472
Resource Relation:
Other Information: PBD: 1997; Related Information: Is Part Of Paul Scherrer Institut annual report 1996. Annex V: PSI general energy technology newsletter 1996; Daum, C.; Leuenberger, J. [eds.]; PB: 125 p.
Subject:
40 CHEMISTRY; ELECTROCHEMISTRY; SURFACES; MICROSCOPY; IRIDIUM OXIDES; THIN FILMS; EXPERIMENTAL DATA
OSTI ID:
492033
Country of Origin:
Switzerland
Language:
English
Other Identifying Numbers:
Other: ON: DE97750556; TRN: CH97E0201
Availability:
OSTI as DE97750556
Submitting Site:
CH
Size:
pp. 31-32
Announcement Date:
Jul 24, 1997

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Citation Formats

Haering, P, Koetz, R, and Siegenthaler, H. Intermittent contact atomic force microscopy in electrochemical environment. Switzerland: N. p., 1997. Web.
Haering, P, Koetz, R, & Siegenthaler, H. Intermittent contact atomic force microscopy in electrochemical environment. Switzerland.
Haering, P, Koetz, R, and Siegenthaler, H. 1997. "Intermittent contact atomic force microscopy in electrochemical environment." Switzerland.
@misc{etde_492033,
title = {Intermittent contact atomic force microscopy in electrochemical environment}
 author = {Haering, P, Koetz, R, and Siegenthaler, H}
 abstractNote = {In situ measurements with Atomic Force Microscopy may cause surface modifications due to the tip-surface interactions. As an alternative and less destructive method, Intermittent Contact Atomic Force Microscopy (ICAFM) has been tested in an electrolytic environment. In the ICAFM mode the tip is not constantly in contact with the surface under investigation but is tapping onto the surface with a certain frequency. A commercial Park Scientific Instruments Microscopy has been modified to enable in situ experiment with ICAFM. It was possible to image iridium oxide films with ICAFM in the electrolytic environment without any noticeable surface modifications. (author) 3 figs., 4 refs.}
 place = {Switzerland}
 year = {1997}
 month = {Jun}
 }