Abstract
Detoxification of fly ash from waste incineration by evaporating harmful heavy metals is limited by the formation of stable heavy metal-matrix compounds. To study the rate of these heavy metal-matrix reactions, experiments were performed with the diffusion couple ZnO (heavy metal)-SiO{sub 2} (matrix). The atomic concentration profiles after different annealing treatments were analysed by X-ray photoelectron spectroscopy (XPS). (author) 3 figs., 4 refs.
Citation Formats
Jakob, A, Stucki, S, Schnyder, B, and Koetz, R.
Solid state diffusion and reaction in ZnO/SiO{sub 2} in thin films.
Switzerland: N. p.,
1997.
Web.
Jakob, A, Stucki, S, Schnyder, B, & Koetz, R.
Solid state diffusion and reaction in ZnO/SiO{sub 2} in thin films.
Switzerland.
Jakob, A, Stucki, S, Schnyder, B, and Koetz, R.
1997.
"Solid state diffusion and reaction in ZnO/SiO{sub 2} in thin films."
Switzerland.
@misc{etde_492029,
title = {Solid state diffusion and reaction in ZnO/SiO{sub 2} in thin films}
author = {Jakob, A, Stucki, S, Schnyder, B, and Koetz, R}
abstractNote = {Detoxification of fly ash from waste incineration by evaporating harmful heavy metals is limited by the formation of stable heavy metal-matrix compounds. To study the rate of these heavy metal-matrix reactions, experiments were performed with the diffusion couple ZnO (heavy metal)-SiO{sub 2} (matrix). The atomic concentration profiles after different annealing treatments were analysed by X-ray photoelectron spectroscopy (XPS). (author) 3 figs., 4 refs.}
place = {Switzerland}
year = {1997}
month = {Jun}
}
title = {Solid state diffusion and reaction in ZnO/SiO{sub 2} in thin films}
author = {Jakob, A, Stucki, S, Schnyder, B, and Koetz, R}
abstractNote = {Detoxification of fly ash from waste incineration by evaporating harmful heavy metals is limited by the formation of stable heavy metal-matrix compounds. To study the rate of these heavy metal-matrix reactions, experiments were performed with the diffusion couple ZnO (heavy metal)-SiO{sub 2} (matrix). The atomic concentration profiles after different annealing treatments were analysed by X-ray photoelectron spectroscopy (XPS). (author) 3 figs., 4 refs.}
place = {Switzerland}
year = {1997}
month = {Jun}
}